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A quantitative EBIC study of dislocations and their interaction with impurities in silicon

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.305415

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:305415
Date	January 1992
Creators	Fell, Timothy S.
Publisher	University of Oxford
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation