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Finite element simulation of VLSI interconnections with application to reliability design optimisation and electromigration modelling

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Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:334059
Date January 1993
CreatorsTrattles, John T.
PublisherUniversity of Newcastle Upon Tyne
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

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