Return to search

The application of focused ion beams to the modification of integrated circuits

No description available.

1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.335784

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:335784
Date	January 1990
Creators	Young, Richard John
Publisher	University of Cambridge
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation