The commercial exploitation of Electronic Speckle Pattern Interferometry (ESPI) is now gathering pace with manufacturers marketing products in Europe and the USA. The power of the technique both in a research and an industrial inspection role has brought pressure from the engineering community for an automated fringe analysis system.
| Identifer | oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:335880 |
| Date | January 1992 |
| Creators | Kerr, David |
| Publisher | Loughborough University |
| Source Sets | Ethos UK |
| Detected Language | English |
| Type | Electronic Thesis or Dissertation |
| Source | https://dspace.lboro.ac.uk/2134/28205 |
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