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The hot carrier induced degradation of Si/SiO←2 interface

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.361539

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:361539
Date	January 1997
Creators	Al-Kofahi, Idrees Solaiman Ali
Publisher	Liverpool John Moores University
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation