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Analogue reliability tests on digital integrated circuits

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.376703

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:376703
Date	January 1986
Creators	Xu, Y.
Publisher	Lancaster University
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation