by Won Hon Kit. / Thesis (M.Phil.)--Chinese University of Hong Kong, 1997. / Includes bibliographical references (leaves 66-70). / by Won Hon Kit. / Acknowledgment --- p.i / Abstract --- p.ii / Chapter Chapter1 --- Introduction --- p.1 / Chapter 1.1 --- Uniqueness of ZnxCd/1-x Se --- p.1 / Chapter 1.2 --- The Choice of OMVPE --- p.1 / Chapter 1.3 --- Epilayer Relaxation in Heteroepitaxy --- p.2 / Chapter 1.4 --- The Most Suitable Substrate --- p.4 / Chapter Chapter2 --- Experimental Procedures --- p.6 / Chapter 2.1 --- Degreasing and Etching --- p.6 / Chapter 2.2 --- Preheating --- p.6 / Chapter 2.3 --- OMVPE Growth --- p.6 / Chapter Chapter3 --- Characterization --- p.9 / Chapter 3.1 --- X-ray Diffraction --- p.9 / Chapter 3.2 --- EDX Spectroscopy --- p.13 / Chapter 3.3 --- Optical Reflectance --- p.15 / Chapter Chapter4 --- Data Analysis --- p.20 / Chapter 4.1 --- Control of Composition --- p.20 / Chapter 4.2 --- Structural Quality and Epilayer Relaxation --- p.22 / Chapter 4.3 --- Critical Point Energies --- p.24 / Chapter 4.4 --- Refractive Index and Extinction coefficient --- p.26 / Chapter Chapter5 --- Conclusions --- p.28 / List of Figures --- p.30 / Reference --- p.66
| Identifer | oai:union.ndltd.org:cuhk.edu.hk/oai:cuhk-dr:cuhk_322148 |
| Date | January 1997 |
| Contributors | Won, Hon Kit., Chinese University of Hong Kong Graduate School. Division of Physics. |
| Source Sets | The Chinese University of Hong Kong |
| Language | English |
| Detected Language | English |
| Type | Text, bibliography |
| Format | print, iv, 70 leaves : ill. ; 30 cm. |
| Rights | Use of this resource is governed by the terms and conditions of the Creative Commons “Attribution-NonCommercial-NoDerivatives 4.0 International” License (http://creativecommons.org/licenses/by-nc-nd/4.0/) |
Page generated in 0.0018 seconds