by Yu-Kit Lam =鉍系超導體在各製備階段之機械及超導特性 / 林宇傑. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2000. / Includes bibliographical references. / Text in English; abstracts in English and Chinese. / by Yu-Kit Lam = Bi xi chao dao ti zai ge zhi bei jie duan zhi ji xie ji chao dao te xing / Lin Yujie. / Table of Contents --- p.i / Acknowledgments --- p.iv / Abstract --- p.v / Chapter Chapter 1 --- Related Work on Bulk Bi-based High Tc Superconductor --- p.1 / Chapter 1.1 --- Historical Background of Superconductivity --- p.1 / Chapter 1.2 --- Basic Properties of Superconductivity --- p.4 / Chapter 1.3 --- Basic Properties of Bi-based Superconductor --- p.7 / Chapter 1.4 --- Fabrication Methods of Bi-based Superconductor --- p.12 / Chapter 1.4.1 --- Precursor Preparation --- p.12 / Chapter 1.4.1.1 --- Solid State Reaction Method --- p.12 / Chapter 1.4.1.2 --- Sol-gel Method --- p.15 / Chapter 1.4.1.3 --- Co-decomposition Method --- p.17 / Chapter 1.4.1.4 --- Freeze-drying and Spray-drying Methods --- p.17 / Chapter 1.4.1.5 --- Comparison for precursor preparation methods --- p.18 / Chapter 1.4.2 --- Pelletization and Sintering --- p.20 / Chapter 1.5 --- Potential applications of Bi-based superconductors --- p.22 / Chapter 1.5.1 --- Criteria for practical applications --- p.22 / Chapter 1.5.2 --- Superconducting tapes --- p.23 / Chapter 1.5.3 --- Current leads --- p.26 / Chapter 1.6 --- Objectives of the Project --- p.27 / Chapter 1.7 --- References --- p.28 / Chapter Chapter 2 --- Fabrication of Bulk Bi(Pb)-2223 Superconductor --- p.33 / Chapter 2.1 --- Introduction --- p.33 / Chapter 2.2 --- Precursor Preparation --- p.33 / Chapter 2.3 --- Grinding Process --- p.34 / Chapter 2.4 --- Pelletization Process --- p.35 / Chapter 2.5 --- The Sintering --- p.37 / Chapter 2.6 --- Characterizations --- p.38 / Chapter 2.7 --- References --- p.40 / Chapter Chapter 3 --- Principles and Instruments of Characterizations --- p.41 / Chapter 3.1 --- Scanning Electron Microscopy and Energy Dispersive X-ray Spectroscopy --- p.41 / Chapter 3.1.1 --- Basic Principle --- p.41 / Chapter 3.1.2 --- Sample Preparation --- p.42 / Chapter 3.2 --- Crystal Structure Determination Using X-ray Diffraction Spectroscopy --- p.44 / Chapter 3.3 --- Vibrating Sample Magnetometer --- p.48 / Chapter 3.3.1 --- Basic Principle --- p.48 / Chapter 3.3.2 --- Sample Preparation --- p.49 / Chapter 3.4 --- Standard Four-Probe Method for Electrical Measurement --- p.51 / Chapter 3.5 --- Density Measurement of Sintered Samples --- p.52 / Chapter 3.6 --- Hardness Tests --- p.54 / Chapter 3.7 --- Determination of Flexural Strength of Sintered Samples --- p.56 / Chapter 3.8 --- References --- p.57 / Chapter Chapter 4 --- Results and Discussions / Chapter 4.1 --- Results from X-Ray Diffraction Spectroscopy --- p.58 / Chapter 4.1.1 --- Green Pellet --- p.58 / Chapter 4.1.2 --- 50-Hour Sintered Pellet --- p.58 / Chapter 4.1.3 --- "100-Hour, 150-Hour, and 200-Hour Sintered Pellets" --- p.59 / Chapter 4.1.4 --- Volume Fraction of the High Tc Phase --- p.59 / Chapter 4.2 --- Microstructure Observed by Scanning Electron Microscopy --- p.63 / Chapter 4.2.1 --- Green Pellet --- p.63 / Chapter 4.2.2 --- 50-Hour Sintered Pellet --- p.64 / Chapter 4.2.3 --- "100-Hour, 150-Hour, and 200-Hour Sintered Pellets" --- p.64 / Chapter 4.3 --- Chemical Composition Using Energy Dispersive X-ray Spectroscopy --- p.68 / Chapter 4.4 --- Results from Vibrating Sample Magnetometer --- p.71 / Chapter 4.5 --- Densification of Sintered Samples --- p.75 / Chapter 4.6 --- Hardness at Various Stages of Processing --- p.77 / Chapter 4.7 --- Flexural Strength at Various Stages of Processing --- p.79 / Chapter 4.8 --- I-V Characterization Using Standard Four-Probe Method --- p.82 / Chapter 4.9 --- Weibull Modulii of Sintered Samples --- p.85 / Chapter 4.10 --- Future Oultlook --- p.86 / Chapter 4.11 --- References --- p.87 / Chapter Chapter 5 --- Summary --- p.89 / Appendix A Polishing of Pelletizing Mold / Chapter A.1 --- Introduction --- p.92 / Chapter A.2 --- Grinding Process --- p.92 / Chapter A.3 --- Final Polishing Process --- p.93
| Identifer | oai:union.ndltd.org:cuhk.edu.hk/oai:cuhk-dr:cuhk_323193 |
| Date | January 2000 |
| Contributors | Lam, Yu-Kit., Chinese University of Hong Kong Graduate School. Division of Physics. |
| Source Sets | The Chinese University of Hong Kong |
| Language | English, Chinese |
| Detected Language | English |
| Type | Text, bibliography |
| Format | print, viii, 95 leaves : ill. ; 30 cm. |
| Rights | Use of this resource is governed by the terms and conditions of the Creative Commons “Attribution-NonCommercial-NoDerivatives 4.0 International” License (http://creativecommons.org/licenses/by-nc-nd/4.0/) |
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