Tse Yee Kit. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2000. / Includes bibliographical references (leaves 55-58). / Abstracts in English and Chinese. / Chapter Chapter 1 --- Introduction / Chapter 1.1 --- Geometric Process and Maintenance Problem --- p.1 / Chapter 1.2 --- Warranty Problem --- p.5 / Chapter 1.3 --- An Outline of the Thesis --- p.8 / Chapter Chapter 2 --- Multistate Deteriorative System / Chapter 2.1 --- The Multistate Model --- p.10 / Chapter 2.2 --- Long-run Average Cost Per Unit Time --- p.15 / Chapter 2.3 --- The Optimal Policy N* --- p.18 / Chapter 2.4 --- The Monotonicity of the Optimal Policy --- p.21 / Chapter Chapter 3 --- Extended Warranty Model / Chapter 3.1 --- The Extended Warranty Model --- p.30 / Chapter 3.2 --- "The Expected Discounted Cost Over the Lifetime Cycle [0,T]" --- p.34 / Chapter 3.2.1 --- Consumer's Discounted Cost --- p.34 / Chapter 3.2.2 --- Manufacturer's Discounted Cost --- p.37 / Chapter 3.3 --- The Exponential Distribution Case --- p.40 / Chapter 3.4 --- Numerical Examples --- p.51 / Bibliography --- p.55
| Identifer | oai:union.ndltd.org:cuhk.edu.hk/oai:cuhk-dr:cuhk_323255 |
| Date | January 2000 |
| Contributors | Tse, Yee Kit., Chinese University of Hong Kong Graduate School. Division of Statistics. |
| Source Sets | The Chinese University of Hong Kong |
| Language | English, Chinese |
| Detected Language | English |
| Type | Text, bibliography |
| Format | print, iv, 58 leaves ; 30 cm. |
| Rights | Use of this resource is governed by the terms and conditions of the Creative Commons “Attribution-NonCommercial-NoDerivatives 4.0 International” License (http://creativecommons.org/licenses/by-nc-nd/4.0/) |
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