Wang Yuhao = 利用X光电子谱和导电原子力显微镜对聚3, 4-乙烯二氧噻酚 : 聚苯磺酸改性的研究 / 王宇昊. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2005. / Includes bibliographical references. / Text in English; abstracts in English and Chinese. / Wang Yuhao = Li yong X guang dian zi pu he dao dian yuan zi li xian wei jing dui ju 3, 4-yi xi er yang sai fen : ju ben huang suan gai xing de yan jiu / Wang Yuhao. / Abstract --- p.ii / 論文摘要 --- p.iii / Acknowledgements --- p.iv / Table of Contents --- p.v / List of Figures --- p.ix / List of Tables --- p.xiii / Chapter CHAPTER 1 --- INTRODUCTION --- p.1 / Chapter 1.1 --- Review of conducting conjugated polymers --- p.1 / Chapter 1.1.1 --- Development of conjugated polymer --- p.1 / Chapter 1.1.2 --- Basic concepts in independent-electron theories of conducting conjugated polymers --- p.2 / Chapter 1.1.2.1 --- "Huckel model and its difficulty, the importance of election-phonon" --- p.2 / Chapter 1.1.2.2 --- The SSH model and dimerization --- p.3 / Chapter 1.1.2.3 --- "Charge carriers in conducting conjugated polymers: soliton, polaron and bipolaron" --- p.5 / Chapter 1.1.3 --- "Poly(3,4-ethylenedioxythiophene) or PEDT" --- p.5 / Chapter 1.1.4 --- Derivatives of PEDT --- p.6 / Chapter 1.1.5 --- Application of PEDT and its derivatives --- p.7 / Chapter 1.2 --- Polymeric light emitting diodes (PLED) --- p.7 / Chapter 1.2.1 --- Invention Polymeric light emitting diodes (PLED) --- p.7 / Chapter 1.2.2 --- Electric structure of PLEDs --- p.7 / Chapter 1.2.3 --- Transition from excitons to photons --- p.8 / Chapter 1.2.4 --- Controlling electron and hole injection --- p.8 / Chapter 1.2.5 --- Application of PEDT-PSS as hole transporting layer in PLED --- p.9 / Chapter 1.2.6 --- "Phase separating in PEDT-PSS blend, removing the PSS rich layer" --- p.9 / Chapter 1.3 --- Motivations of the thesis work --- p.10 / References --- p.10 / Chapter CHAPTER 2 --- INSTRUMENTATION --- p.27 / Chapter 2.1 --- X-ray Photoelectron Spectroscopy --- p.27 / Chapter 2.1.1 --- History of XPS techniques --- p.27 / Chapter 2.1.2 --- Physical Basis --- p.28 / Chapter 2.1.3 --- Chemical Shift of Binding Energy in XPS --- p.29 / Chapter 2.1.4 --- Binding Energy Referencing in XPS --- p.29 / Chapter 2.1.5 --- Sampling Depth of XPS --- p.30 / Chapter 2.1.6 --- Instrumental Setup of XPS --- p.30 / Chapter 2.2 --- Scanning Probe Microscopy --- p.31 / Chapter 2.2.1 --- Introduction --- p.31 / Chapter 2.2.2 --- Atomic Force Microscopy and Conductive Atomic Force Microscopy --- p.31 / Chapter 2.2.3 --- Instrumental Setup for Conductive AFM --- p.32 / Chapter 2.3 --- The Low Energy Ion Beam (LEIB) system at CUHK --- p.32 / Chapter 2.3.1 --- Introduction --- p.32 / Chapter 2.3.2 --- Principle --- p.33 / Chapter 2.3.3 --- Instrumentation Setup --- p.33 / References --- p.33 / Chapter CHAPTER 3 --- Effects of Ar+ bombardment at 500 and 100eV --- p.42 / Chapter 3.1 --- Introduction --- p.42 / Chapter 3.2 --- Sample Preparation --- p.42 / Chapter 3.3 --- Ar+ sputtering and XPS measurement of the sputtered sample. --- p.43 / Chapter 3.4 --- Results and Discussion --- p.44 / References --- p.49 / Chapter CHAPTER 4 --- Effects of annealing on PEDT-PSS thin films studied by XPS and AFM --- p.60 / Chapter 4.1 --- Introduction --- p.60 / Chapter 4.2 --- Sample Preparation --- p.60 / Chapter 4.3 --- XPS measurements and results --- p.61 / Chapter 4.3.1 --- XPS of C 1s core level of PEDT-PSS --- p.61 / Chapter 4.3.2 --- XPS of O 1s core level of PEDT-PSS --- p.62 / Chapter 4.3.3 --- XPS of S 2p core level of PEDT-PSS --- p.62 / Chapter 4.3.4 --- XPS of Valence Band of PEDT-PSS --- p.64 / Chapter 4.4 --- C-AFM measurements and results --- p.65 / Chapter 4.4.1 --- C-AFM measurements on PEDT-PSS --- p.65 / Chapter 4.5 --- Measurements and results about film insolubility and conductivity --- p.65 / Chapter 4.5.1 --- Insolubility measurements --- p.66 / Chapter 4.5.2 --- Conductivity measurements --- p.66 / Chapter 4.5.3 --- Results from the film insolubility and conductivity measurements --- p.66 / Chapter 4.6 --- Conclusion --- p.67 / References --- p.68 / Chapter CHAPTER 5 --- Effects of low energy proton bombardment of PEDT-PSS films studied by XPS and AFM --- p.90 / Chapter 5.1 --- Introduction --- p.90 / Chapter 5.2 --- XPS and c-AFM studies of PEDT-PSS films bombarded by H+ --- p.90 / Chapter 5.2.1 --- Sample preparation --- p.90 / Chapter 5.2.2 --- Results and discussion --- p.90 / Chapter 5.3 --- Conductivity measurements --- p.92 / Chapter 5.3.1 --- Sample preparation for conductivity measurements --- p.92 / Chapter 5.3.2 --- Results and discussion --- p.93 / Chapter 5.4 --- Conclusion --- p.93 / References --- p.93 / Chapter CHAPTER 6 --- Concluding Remarks and Future Works --- p.106 / Chapter 6.1 --- Concluding Remarks --- p.106 / Chapter 6.2 --- Future Work --- p.106 / Chapter APPENDIX --- The SSH model in describing polyacetylene --- p.108 / Chapter Part 1 --- Assumptions of the SSH model --- p.108 / Chapter Part 2 --- Bloch model and SSH model. --- p.113 / Reference --- p.117
| Identifer | oai:union.ndltd.org:cuhk.edu.hk/oai:cuhk-dr:cuhk_325435 |
| Date | January 2005 |
| Contributors | Wang, Yuhao., Chinese University of Hong Kong Graduate School. Division of Physics. |
| Source Sets | The Chinese University of Hong Kong |
| Language | English, Chinese |
| Detected Language | English |
| Type | Text, bibliography |
| Format | print, xiii, 108 leaves : ill. (some col.) ; 30 cm. |
| Rights | Use of this resource is governed by the terms and conditions of the Creative Commons “Attribution-NonCommercial-NoDerivatives 4.0 International” License (http://creativecommons.org/licenses/by-nc-nd/4.0/) |
Page generated in 0.002 seconds