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Thermal stability of SrFeO3SiO2Si and SrFeO3AI2O3 thin film systems : transmission electron microscopy study of interfacial structures of the thin film systems and conductometric sensing response of SrFeO3AI2O3

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Identiferoai:union.ndltd.org:mcgill.ca/oai:escholarship.mcgill.ca:fn1072616
Date January 2007
CreatorsWang, Dashan, 1948-
PublisherMcGill University
Source SetsMcGill University
Languagehttp://id.loc.gov/vocabulary/iso639-2/eng
Detected LanguageEnglish
TypeThesis
RightsAll items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.
RelationProquest: AAINR66701, Pid: 115907

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