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A new design of built-in self-testing programmable logic arrays with high fault coverage and low overhead /

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Identiferoai:union.ndltd.org:mcgill.ca/oai:escholarship.mcgill.ca:zc77sr15j
Date January 1985
CreatorsTreuer, Robert.
PublisherMcGill University
Source SetsMcGill University
Languagehttp://id.loc.gov/vocabulary/iso639-2/eng
Detected LanguageEnglish
TypeThesis
RightsAll items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.
RelationProquest: AAIML21616, Pid: 63215

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