The memory cells used in modern field programmable gate arrays (FPGAs) are highly
susceptible to single event upsets (SEUs). The typical mitigation strategy in the industry is some form of hardware redundancy in the form of duplication with comparison (DWC) or triple modular redundancy (TMR). While this strategy is highly effective in masking out the effect of faults, it incurs a large hardware cost. In this thesis, we explore a different approach to hardware redundancy. The core idea of our approach is to exploit the conflict-driven clause learning (CDCL) mechanism in modern Boolean satisfiability (SAT) solvers to provide us with
invariants which can be realized as hardware checkers. Furthermore, we develop the algorithms required to select a subset of these invariants to be included as part of a checker circuit. This checker circuit then augments the original FPGA design. We find which look-up table (LUT) memory cells are sensitive to bitflips, then we automatically generate a checker circuit consisting of hardware invariants targeted towards those faults. We aim to reach 100% coverage of sensitizable faults. After extensive experimentation, we conclude that this approach is not competitive with DWC with respect to hardware area. However, we demonstrate that many bitflips will have reduced a detection latency compared to DWC. / Thesis / Master of Applied Science (MASc)
| Identifer | oai:union.ndltd.org:mcmaster.ca/oai:macsphere.mcmaster.ca:11375/26079 |
| Date | January 2020 |
| Creators | Dumitrescu, Stefan |
| Contributors | Nicolici, Nicola, Electrical and Computer Engineering |
| Source Sets | McMaster University |
| Language | English |
| Detected Language | English |
| Type | Thesis |
Page generated in 0.0025 seconds