The paper primarily outlines fundamental issues of electron microscopy. The paper follows with analysing pumping of gas into EREM sample chambers at various pressure levels by using SolidWorks Flow Simulation in SolidWorks system. The results of analyses are assessed with respect to requirements so that the pressure in the track of primarily electrons is as low as possible with the view to reduce probability of its scattering.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:218730 |
| Date | January 2010 |
| Creators | Placzek, Roman |
| Contributors | Špinka, Jiří, Maxa, Jiří |
| Publisher | Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
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