This thesis is divided into three main sections that deal with optical and magnetic thin films properties and their measurements techniques. Principles of the spectroscopic reflectometry and measurements of optical properties are described in the first part. Results of imaging reflectometry are most important. This technique is based on in situ monitoring of optical properties of SiO2 thin films during etching over the area cca 10 × 13 mm2. In next section magnetic properties of thin films and new apparatus built on the Institute of Physical Engineering of BUT are shown. Magnetic properties were observed by longitudinal magneto-optical Kerr effect. The construction of the device is based on a light beam with rectilinear polarization reflected from magnetic material with turned polarization. For investigation of local magnetic properties of microstructures a microscope objective focusing laser beam on the sample is used. The last part of the thesis is aimed on improving of a spin valve structure Co/Cu/NiFe. This work was done within the frame of the Erasmus project in Laboratoire Louis Néel in Grenoble. The goal was to achieve the value of GMR (Giant Magnetoresistance) as high as possible by changing of deposition parameters. This value describes the rate of resistances in different mutual directions of magnetization in trilayers.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:227912 |
| Date | January 2008 |
| Creators | Plšek, Radek |
| Contributors | Navrátil, Karel, Spousta, Jiří |
| Publisher | Vysoké učení technické v Brně. Fakulta strojního inženýrství |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
Page generated in 0.0024 seconds