Electron backscatter diffraction (EBSD) is a common tool used by phy- sicists to examine crystalline materials, which is based on taking pictures of material microstructure using electron microscope. To determine additional characteristics of studied specimen, a specific variant called High resolution EBSD has been proposed (and partially adopted). The technique takes se- veral subregions of the images taken by the EBSD camera and uses cross- correlation to measure deformation of obtained patterns. Usability of this method is limited by its relatively high computational complexity, which makes it useless for the analysis of larger specimen surfaces. At the same time, processing of individual subregions and images is independent, which makes it appropriate for parallelization provided by modern GPUs. In this thesis, we describe the technique used to process the EBSD data in detail, analyze it and implement the most computationally demanding parts using the CUDA technology. Compared to a reference Python implementation, we measured a speedup of 30-40-times when using a double floating precision and up to a 270-times speedup for a single precision.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:438034 |
| Date | January 2021 |
| Creators | Bali, Michal |
| Contributors | Kruliš, Martin, Šikudová, Elena |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
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