In this paper a test set embedding based on accumulator driven by an odd additive constant is presented. The problem is formulated around finding the location of the test pattern in the sequence generated by the accumulator, given a odd constant C and test set T, in terms of linear Diophantine equation of two variables. We show that the search space for finding the best constant corresponding to the shortest length, is greatly reduced. Experimental results show a significant improvement in run time with practically acceptable test length.
| Identifer | oai:union.ndltd.org:siu.edu/oai:opensiuc.lib.siu.edu:theses-1025 |
| Date | 01 January 2009 |
| Creators | Sudireddy, Samara Simha Reddy |
| Publisher | OpenSIUC |
| Source Sets | Southern Illinois University Carbondale |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | Theses |
Page generated in 0.0018 seconds