Thesis (Ph. D.)--Ohio State University, 1987. / Includes vita. Includes bibliographical references (leaves 237-250). Available online via OhioLINK's ETD Center.

Thesis (M.S. in Management)--Naval Postgraduate School, June 1990. / Thesis Advisor(s): Trietsch, Dan. Second Reader: McMasters, Alan W. "June 1990." Description based on signature page as viewed on October 21, 2009. DTIC Identifier(s): Reduction, information exchange, production management, setup time, theses. Author(s) subject terms: SMED, production management, setup time, NADEP. Includes bibliographical references (p. 94-95). Also available in print.

Thesis, PlanB (M.S.)--University of Wisconsin--Stout, 2004. / Field problem. Includes bibliographical references.

No description available.

Thesis (M.B.A.)--Boston University / PLEASE NOTE: Boston University Libraries did not receive an Authorization To Manage form for this thesis or dissertation. It is therefore not openly accessible, though it may be available by request. If you are the author or principal advisor of this work and would like to request open access for it, please contact us at open-help@bu.edu. Thank you. / 2031-01-01

Typescript (photocopy). / Digitized by Kansas Correctional Industries

Thesis (M.B.A.)--Boston University / PLEASE NOTE: Boston University Libraries did not receive an Authorization To Manage form for this thesis or dissertation. It is therefore not openly accessible, though it may be available by request. If you are the author or principal advisor of this work and would like to request open access for it, please contact us at open-help@bu.edu. Thank you. / 2031-01-01

Thesis (M.Eng.)--University of Louisville, 2007. / Title and description from thesis home page (viewed December 14, 2007). Department of Industrial Engineering. Vita. "June 2007." Includes bibliographical references (p. 35).

This study presents the results of using common two or three-parameter "default" distributions in place of "best fit distributions" in simulations of serial production lines with finite buffers and blocking. The default distributions used instead of the best-fit distribution are chosen such that they are non-negative, unbounded, and can match either the first two moments or the first three moments of the collected data. Furthermore, the selected default distributions must be commonly available (or easily constructed from) distributions in simulation software packages. The lognormal is used as the two-parameter distribution to match the first two moments of the data. The two-level hyper-exponential and three-parameter lognormal are used as three-parameter distributions to match the first three moments of the data. To test the use of these distributions in simulations, production lines have been separated into two major classes: automated and manual. In automated systems the workstations have fixed processing times and random time between failures, and random repair times. In manual systems, the workstations are reliable but have random processing times. Results for both classes of lines show that the differences in throughput from simulations using best-fit distributions and two parameter lognormal is small in some cases and can be reduced in others by matching the first three moments of the data. Also, different scenarios are identified which lead to higher differences in throughput when using a two-parameter default distribution. / Graduation date: 2004

Thesis (Ph. D.)--Ohio State University, 1981. / Includes bibliographical references (leaves 351-358). Available online via OhioLINK's ETD Center.