Spelling suggestions: "subject:"671201 entegrated circuits anda devices"" "subject:"671201 entegrated circuits ando devices""
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Characterization of hot-carriers induced degradation via small signal characterisations in MOSFETSLau, M. P. Unknown Date (has links)
No description available.
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Silicon-on-sapphire MOSFETs parameters extraction by small-signal measurementKong, F. Unknown Date (has links)
No description available.
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