The possibility to change magnetic anisotropy of amorphous TbCo films from out-of-plane to in-plane has been investigated. The effects of TbCo film's thickness and composition on the magnetic anisotropy were investigated together with the effects of growing the TbCo films on a SmCo seed layer. This was studied by sputtering TbCo films of composition Tb_xCo_(100-x) x=16,18,20,22 and 24, with thickness ranging between 2-20 nm, with and without the presence of a 20 nmSm_15Co_85 seed layer. All films were grown in a 130 mT magnetic in-plain field to imprint an in-plane anisotropy. The structure and composition of the films were examined with Rutherford backscattering spectrometry, X-ray reflectivity, and Grazing incidence X-ray diffraction. The magnetic properties of the films were studied with magneto-optic Kerr effect measurement, vibrating sample magnetometer, Kerr microscopy and magnetic force microscopy. The magneto-optic Kerr effect measurement showed that it was possible to change TbCo film's preferred magnetization direction from out-of-plane to in-plane by reducing the film thickness. The SmCo layer made it easier for theTbCo films to change preferred magnetization direction from out-of-plane to in-plane.