Methods for Extending High-Performance Automated Test Equipment (ATE) using Multi-Gigahertz FPGA Technologies Ashraf M. Majid 264 Pages Directed by Dr. David Keezer This thesis presents methods for developing multi-function, multi-GHz, FPGAbased test modules designed to enhance the performance capabilities of automated test equipment (ATE). The methods are used to develop a design approach that utilizes a test module structure in two blocks. A core logic block is designed using a multi-GHz FPGA that provides control functions. Another block called the â application specificâ logic block includes components required for specific test functions. Six test functions are demonstrated in this research: high-speed signal multiplexing, loopback testing, jitter injection, amplitude adjustment, and timing adjustment. Furthermore, the test module is designed to be compatible with existing ATE infrastructure, thus retaining full ATE capabilities for standard tests. Experimental results produced by this research provide evidence that the methods are sufficiently capable of enhancing the multi-GHz testing capabilities of ATE and are extendable into future ATE development. The modular approach employed by the methods in this thesis allow for flexibility and future upgradability to even higher frequencies. Therefore the contributions made in this thesis have the potential to be used into the foreseeable future for enhancements to semiconductor test capabilities.

Functional Test of any given system is used to verify that the top level system is performing according to the specifications and all of the sub systems, i.e., hardware, software, inputs, outputs and sensors are operating properly. The term System is used here in context of any device or equipment consisting of hardware, software, sensors, virtual sensors and inputs / outputs. One of the examples of such a system is a semiconductor fabrication equipment. There have only been a few approaches that are used to perform the functional test of a system. Engineers typically develop custom test equipment to interface with the system under test and determine proper functioning of all the sub systems and behavior of overall system. In another method, domain experts, utilize the software of the system under test, and manually actuate / stimulate sub systems and then observe and record outcomes to determine whether the system exhibited correct behavior. A novel solution of a reusable functional test automation framework is developed. The framework interfaces with the system under test via the exposed API, and allow domain experts with minimal or no programming background to create test suites to methodically test overall functionality of the system. / text

The traditional radiation testing of space electronics has been used for more than fifty years to support the radiation hardness assurance. Its typical goal is to ensure reliable operation of the spacecraft in the harsh environment of space. This PhD research looks into the radiation testing from a different perspective; the goal is to develop radiation testing methods that are focused not only on the reliability of the components but also on a continuous radiation-induced degradation of their performance. Such data are crucial for the understanding of the impact of radiation on the measurement uncertainty of data acquisition systems onboard research space missions.