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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

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Spelling suggestions: "subject:"bilayer anda multilayer than fim systems"" "subject:"bilayer anda multilayer then fim systems""

1

Spectroscopic Ellipsometry Characterization of Single and Multilayer Aluminum Nitride/Indium Nitride Thin Film Systems

Khoshman, Jebreel M. 07 December 2005 (has links)
No description available.
Physics, Condensed Matter
Nitride
Optical constants
Amorphous Semiconductors
Optical filters
Bilayer and multilayer thin film systems

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