by Yeung Sau Lai Catherine. / Thesis (M.Phil.)--Chinese University of Hong Kong, 1999. / Includes bibliographical references. / Text in English; abstracts in English and Chinese. / by Yeung Sau Lai Catherine. / Acknowledgments --- p.i / Abstract --- p.ii / Table of Contents --- p.iv / List of Figures --- p.vii / List of Tables --- p.ix / Chapter Chapter1 --- Introduction to the Study of Chinese antique objects using surface science techniques / Chapter 1.1 --- Surface Science --- p.1 / Chapter 1.2 --- Surface Science Techniques --- p.1 / Chapter 1.3 --- Study of Antiques Objects --- p.2 / Chapter 1.4 --- Chinese Antique --- p.4 / Chapter 1.5 --- Aims of the current study --- p.4 / Chapter 1.6 --- Reference --- p.7 / Chapter Chapter 2 --- Silicon on Chinese Bronze Seals / Chapter 2.1 --- Introduction --- p.8 / Chapter 2.2 --- Basic Principles of the analytical techniques --- p.9 / Chapter 2.2.1 --- Scanning electron microscopy (SEM) --- p.9 / Chapter 2.2.2 --- Energy dispersive x-ray analysis (EDX) --- p.9 / Chapter 2.2.3 --- X-ray Photoelectron spectroscopy (XPS) --- p.13 / Chapter 2.3 --- Sample --- p.16 / Chapter 2.4 --- Experimental --- p.18 / Chapter 2.4.1 --- Instrument --- p.18 / Chapter 2.4.2 --- Sampling --- p.18 / Chapter 2.5 --- Results and Discussion --- p.20 / Chapter 2.5.1 --- Chemical Composition --- p.20 / Chapter 2.5.2 --- Silicon content --- p.21 / Chapter 2.5.3 --- Sources of silicon --- p.21 / Chapter 2.5.4 --- Implication of high silicon content --- p.25 / Chapter 2.6 --- Conclusion --- p.28 / Chapter 2.7 --- Related studies --- p.28 / Chapter 2.8 --- Reference --- p.29 / Chapter Chapter 3 --- Surface analysis of Chinese Jade using Fourier Transform Infrared Spectroscopy with fixed angle reflectance technique / Chapter 3.1 --- Introduction --- p.30 / Chapter 3.2 --- principles of FTIR and specular reflectance technique --- p.31 / Chapter 3.2.1 --- General principles --- p.31 / Chapter 3.2.2 --- IR spectrometer --- p.31 / Chapter 3.2.3 --- Specular (External) Reflectance Technique --- p.33 / Chapter 3.2.4 --- Kramers-Kronig Transformation --- p.33 / Chapter 3.3 --- Sample (Chinese Jade from the Liang-zhu Culture) --- p.36 / Chapter 3.3.1 --- Background on use of Jade in China --- p.36 / Chapter 3.3.2 --- Nomenclature --- p.39 / Chapter 3.3.3 --- Mineralogy of Jade --- p.39 / Chapter 3.3.4 --- Liang-zhu Culture --- p.40 / Chapter 3.4 --- Experimental --- p.40 / Chapter 3.4.1 --- Instrument --- p.40 / Chapter 3.4.2 --- Sampling --- p.44 / Chapter 3.4.3 --- Data Treatment --- p.44 / Chapter 3.5 --- Results and Discussion --- p.44 / Chapter 3.5.1 --- Characteristic of Specular reflectance spectrum of Nephrite --- p.44 / Chapter 3.5.2 --- Reflectance spectrum of Liangzhu samples --- p.57 / Chapter 3.5.2.1 --- Comparison within sample --- p.57 / Chapter 3.5.2.2 --- Comparison among sample --- p.57 / Chapter 3.5.3 --- "Reflectance spectrum of heirloom pieces from the Art Museum, CUHK" --- p.58 / Chapter 3.5.4 --- Absorption peaks at 3000-2800cm-1 --- p.58 / Chapter 3.6 --- Conclusion --- p.58 / Chapter 3.7 --- Related studies --- p.61 / Chapter 3.8 --- Reference --- p.61 / Chapter Chapter 4 --- SIMS and TIMS Analysis on Lead Isotopes Ratio in Ancient Chinese Metallic Artifacts / Chapter 4.1 --- Introduction --- p.63 / Chapter 4.2 --- Background --- p.64 / Chapter 4.2.1 --- Lead isotope --- p.64 / Chapter 4.2.2 --- Aims of this study --- p.66 / Chapter 4.3 --- Basic principle of TIMS and SIMS --- p.67 / Chapter 4.4 --- Experimental --- p.68 / Chapter 4.4.1 --- Sample --- p.68 / Chapter 4.4.2 --- Instrument --- p.68 / Chapter 4.4.2.1 --- Thermal Ionisation mass spectrometry --- p.68 / Chapter 4.4.2.2 --- Secondary ion mass spectroscopy --- p.70 / Chapter 4.5 --- Results and Discussion --- p.72 / Chapter 4.5.1 --- Data Interpretation --- p.72 / Chapter 4.5.2 --- Standard deviation of SIMS data --- p.74 / Chapter 4.5.3 --- Possible use of SIMS data --- p.74 / Chapter 4.6 --- Conclusion --- p.76 / Chapter 4.7 --- References --- p.76 / Chapter Chapter 5 --- Analysis by Particle Induced X-ray emission technique / Chapter 5.1 --- Introduction --- p.79 / Chapter 5.2 --- Basic principle --- p.80 / Chapter 5.2.1 --- General principle --- p.80 / Chapter 5.2.2 --- Fundamental Set up --- p.80 / Chapter 5.2.3 --- Data analysis --- p.82 / Chapter 5.3 --- Experimental --- p.82 / Chapter 5.3.1 --- PIXE --- p.82 / Chapter 5.3.2 --- Sample --- p.82 / Chapter 5.4 --- Result --- p.85 / Chapter 5.5 --- Further studies --- p.85 / Chapter 5.6 --- Reference --- p.85 / Chapter Chapter 6 --- Conclusion / Chapter 6.1 --- Conclusion --- p.88 / Chapter 6.2 --- Further studies --- p.89