NDLTD Global ETD Search
  • Refine Query
  • Source
  • Publication year
  • to
  • Language
  • 1
  • Tagged with
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

Search results

Showing 1 to 1 of 1 (0.036 seconds)

Spelling suggestions: "subject:"circuit under test"" "subject:"circuit under est""

1

Optimal design of VLSI structures with built-in self test based on reduced pseudo-exhaustive testing

Pimenta, Tales Cleber January 1992 (has links)
No description available.
VLSI structures
pseudo-exhaustive testing
Circuit Under Test
Built-In Self Test
algorithmic approaches

Page generated in 0.0388 seconds