Post-silicon validation is an important step during the implementation flow of digital integrated circuits and systems. Most of the validation strategies are based on ad-hoc solutions, such as guidelines from best practices, decided on a case-by-case basis for a specific design and/or application domain. Developing systematic approaches for post-silicon validation can mitigate the productivity bottlenecks that have emerged due to both design diversification and shrinking implementation cycles. Ever since integrating on-chip memory blocks became affordable, embedded logic analysis has been used extensively for post-silicon validation. Deciding at design time which signals to be traceable at the post-silicon phase, has been posed as an algorithmic problem a decade ago. Most of the proposed solutions focus on how to restore as much data as possible within a software simulator in order to facilitate the analysis of functional bugs, assuming that there are no electrically-induced design errors, e.g., bit- flips. In this thesis, first it is shown that analyzing the logic inconsistencies from the post-silicon traces can aid with the detection of bit-flips and their root-cause analysis. Furthermore, when a bit-flip is detected, a list of suspect nets can be automatically generated. Since the rate of bit-flip detection as well the size of the list of suspects depends on the debug data that was acquired, it is necessary to select the trace signals consciously. Subsequently, new methods are presented to improve the bit-flip detectability through an algorithmic approach to selecting the on-chip trace signals. Hardware assertion checkers can also be integrated on-chip in order to detect events of interest, as defined by the user. For example, they can detect a violation of a design property that captures a relationship between internal signals that is supposed to hold indefinitely, so long as no bit-flips occur in the physical prototype. Consequently, information collected from hardware assertion checkers can also provide useful debug information during post-silicon validation. Based on this observation, the last contribution from this thesis presents a novel method to concurrently select a set of trace signals and a set of assertions to be integrated on-chip. / Thesis / Doctor of Philosophy (PhD)