With the rise of automation in traditional manufacturing processes, more companies are beginning to integrate computer integrated manufacturing (CIM) cells on their production floors. Through CIM cell integration, companies have the ability to reduce process time and increase production. One of the problems created with CIM cell automation is caused by the dependency the sequential steps have on one another. Dependency created by the previous step increases the probability that a process error could occur due to previous variation. One way to eliminate this dependency is through the use of an in-process measuring device such as a Renishaw spindle probe used in conjunction with a computer numerical control (CNC) milling machine. Western Kentucky University (WKU) utilizes a CIM cell in the Senator Mitch McConnell Advanced Manufacturing and Robotics laboratory. The laboratory is located in the Architectural and Manufacturing Sciences department and gives students the opportunity to learn how automated systems can be integrated. The CIM cell consists of three Mitsubishi six-axis robots, a Haas Mini-mill, a Haas GT-10 lathe, an AXYZ, Inc. CNC router table, 120 watt laser engraver, an Automated Storage and Retrieval System (ASRS), material handling conveyor, and vision station. The CIM cell functions throughout the curriculum as a means for applied learning and research. The researcher used this CIM cell in order to determine if an in-process measuring device, such as the Renishaw spindle probe, had the ability to affect process capability. The researcher conducted the study to see if an in-process measuring device can be integrated into the CIM cell located in the Senator Mitch McConnell Advanced Manufacturing and Robotics laboratory to eliminate compounding variation. The researcher discovered that through the use of a Renishaw 40-2 spindle probe used in conjunction with a CNC Haas Mini Mill, process capability has the potential to be improved in a CIM cell by accounting for compounding variation present in the process.