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Modeling of integrated circuit interconnect dielectric reliability based on the physical design characteristicsHong, Changsoo. January 2006 (has links)
Thesis (Ph. D.)--Electrical and Computer Engineering, Georgia Institute of Technology, 2007. / Linda Milor, Committee Chair ; Gary May, Committee Member ; Russell Dupuis, Committee Member ; Sung-Kyu Lim, Committee Member ; Mei-Yin Chou, Committee Member.
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