Thesis (Ph. D.)--University of Queensland, 2001. / Includes bibliographical references.

No description available.

Photoemission Electron Microscopy (PEEM) is a versatile tool that relies on the photoelectric effect to produce high-resolution electron images. Ultrafast pulse lasers allow for multi-photon PEEM where multiple visible or IR photons excite a single electron in a nonlinear process. The photoelectron yield in both cases is related to the near-field region of electromagnetic fields at the surface of the sample. We use this ability here to analyze wave propagation in a linear dielectric waveguide with wavelengths of 410 nm and 780 nm. The propagation constant of the waveguide can be extracted from interference patterns created by light propagating in the waveguide and incident light. Various properties like the polarization dependence of the propagation can be analyzed. The electromagnetic field interaction at the boundaries can then be deduced, which is essential to understand power flow in wave guiding structures. These results match well with simulations using finite element techniques as well as electromagnetic theory.

No description available.

No description available.

Thesis (Ph. D.)--Oregon State University, 1993. / Typescript (photocopy). Includes bibliographical references (leaves 102-110). Also available on the World Wide Web.

The propagation of light beams in inhomogeneous dielectric media is considered. The derivation begins with first principles and remains general enough to include off-axis asymmetric multimode input beams in tapered lenslike media with spatial variations of gain or loss. The tapering of lenslike media leads to a number of important applications. A parabolic taper is proposed as a model for a heated axially stretched fiber taper, and beams in such media are fully characterized. Other models are proposed by the concatenation of a parabola with other taper functions.

The main objective of this research is to fabricate and characterize an optically integrated interferometric sensor on standard silicon and silicon CMOS circuitry. An optical sensor system of this nature would provide the high sensitivity and immunity to electromagnetic interference found in interferometric based sensors in a lightweight, compact package capable of being deployed in a multitude of situations inappropriate for standard sensor configurations. There are several challenges involved in implementing this system. These include the development of a suitable optical emitter for the sensor system, the interface between the various optically embedded components, and the compatibility of the Si CMOS with heterogeneous integration techniques. The research reported outlines a process for integrating an integrated sensor on Si CMOS circuitry using CMOS compatible materials, integration techniques, and emitter components.