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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
1

Stress and microstructure of sputter deposited thin copper and niobium films

Okolo, Brando Chidi, January 2003 (has links)
Zugl.: Stuttgart, Univ., Diss., 2003.
2

In situ tensile testing at the limits of x-ray diffraction a new synchrotron based technique /

Böhm, Jochen. January 2004 (has links)
Zugl.: Stuttgart, Univ., Diss., 2004.
3

Determining intrinsic stresses in layered materials via nanoindentation – the question of in principle feasibility

Schwarzer, Norbert 15 February 2006 (has links) (PDF)
The paper treats the question of feasibility of measuring intrinsic thin film stresses due to nanoindentation. A variety of different methods is proposed and analysed with respect to their applicability. As this accuracy-estimation results in boundary conditions for the measurements which can not be fulfilled yet, the whole topic is considered from a purely academic point of few. With the help of a special software package [25] the following methods are considered: 1. Taking the moment of beginning plastic flow within the substrate as indictor, 2. Taking the moment of beginning plastic flow within the film as indictor, 3. Applying mixed loads (normal and lateral forces), 4. Applying the concept of the effectively shaped indenter. While the methods 2 to 4 appear to be in principle feasible, method 1 can completely be ruled out as being of no practical use. The mentioned software package (FilmDoctor prototype) is part of the supplemental material of this study.
4

Determining intrinsic stresses in layered materials via nanoindentation – the question of in principle feasibility

Schwarzer, Norbert 15 February 2006 (has links)
The paper treats the question of feasibility of measuring intrinsic thin film stresses due to nanoindentation. A variety of different methods is proposed and analysed with respect to their applicability. As this accuracy-estimation results in boundary conditions for the measurements which can not be fulfilled yet, the whole topic is considered from a purely academic point of few. With the help of a special software package [25] the following methods are considered: 1. Taking the moment of beginning plastic flow within the substrate as indictor, 2. Taking the moment of beginning plastic flow within the film as indictor, 3. Applying mixed loads (normal and lateral forces), 4. Applying the concept of the effectively shaped indenter. While the methods 2 to 4 appear to be in principle feasible, method 1 can completely be ruled out as being of no practical use. The mentioned software package (FilmDoctor prototype) is part of the supplemental material of this study.

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