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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

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Spelling suggestions: "subject:"electrodiffusion. entegrated circuits"" "subject:"electrodiffusion. antegrated circuits""

1

Electromigration critical length effect and early failures in Cu/oxide and Cu/low k interconnects

Lee, Ki-don. January 2003 (has links) (PDF)
Thesis (Ph. D.)--University of Texas at Austin, 2003. / Vita. Includes bibliographical references. Available also from UMI Company.
Electrodiffusion. Integrated circuits

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