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Unique physical properties such as small effective mass, high electron drift velocities, high electron mobility and small band gap energy make InN a candidate for applications in high-speed microelectronic and optoelectronic devices. The aim of this research is to understand the surface properties, desorption kinetics and thermal stability of InN epilayers that affect the growth processes and determine film quality as well as device performance and life time. We have investigated the structural properties, the surface desorption kinetics, and the thermal stability using Auger electron spectroscopy (AES), x-ray diffraction (XRD), Raman spectroscopy, atomic force microscopy (AFM), high resolution electron energy loss spectroscopy (HREELS), and temperature programmed desorption (TPD). Investigations on high pressure chemical vapor deposition (HPCVD)-grown InN samples revealed the presence of tilted crystallites, which were attributed to high group V/III flux ratio and lattice mismatch. A study of the thermal stability of HPCVD-grown InN epilayers revealed that the activation energy for nitrogen desorption was 1.6±0.2 eV, independent of the group V/III flux ratio. Initial investigations on the ternary alloy In0.96Ga0.04N showed single-phase, N-polar epilayers using XRD and HREELS, while a thermal desorption study revealed an activation energy for nitrogen desorption of 1.14 ± 0.06 eV. HREELS investigations of atomic layer epitaxy (ALE)-grown InN revealed vibrational modes assigned to N-N vibrations. The atomic hydrogen cleaned InN surface also exhibited modes assigned to surface N-H without showing In-H species, which indicated N-polar InN. Complete desorption of hydrogen from the InN surface was best described by the first-order desorption kinetics with an activation energy of 0.88 ± 0.06 eV and pre-exponential factor of (1.5 ± 0.5) ×105 s-1. Overall, we have used a number of techniques to characterize the structure, surface bonding configuration, thermal stability and hydrogen desorption kinetics of InN and In0.96Ga0.04N epilayers grown by HPCVD and ALE. High group V/III precursors ratio and lattice mismatch have a crucial influence on the film orientation. The effects of hydrogen on the decomposition add to the wide variation in the activation energy of nitrogen desorption. Presence of surface defects lowers the activation energy for hydrogen desorption from the surface.

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This thesis is comprised of two closely related studies of fullerenes. The first part is an investigation of C60 and C70 nanocrystals using both experimental and simulated electron energy loss (EEL) spectra. Through a detailed comparison of particular features in EEL spectra collected from these materials in a transmission electron microscope, with simulated spectra, it is established that differences in spectra from different materials can be linked to particular aspects of the structural models. For example, in the case of C60 differences in experimental spectra from different samples can be linked to differences in the bond lengths within the molecules of different samples. In the case of C70, it is found that features within the spectrum which have previously been attributed to the ten equatorial atoms do not have this origin in a crystal. The second part is an experimental investigation of endohedral fullerenes Nd@C82 and Sc3N@C80. The effect of temperature on the EEL spectrum is investigated and, in the case of Nd@C82, the effect of the presence of different isomers is also investigated. Spectra are successfully obtained from the encapsulated atoms, and the importance of careful experiments in terms of avoiding contamination is highlighted.

This thesis explores the theory describing wavefunctions and images, both elastic and inelastic, formed in scanning transmission electron microscopy. / A method is presented for calculating the elastic wavefunction based upon a new formulation of the boundary conditions which couples the probe to Bloch states within the crystal in a single step. Though this method is fundamentally equivalent to previous approaches based upon the superposition of wavefunctions corresponding to individual plane wave components in the incident probe, it provides new insight into the some of the dynamics, allows for efficient calculations, and proves useful for demonstrating well known results such as reciprocity relations. A formal inversion technique is also presented that uses a collection of diffraction plane data in scanning transmission electron microscopy to reconstruct the object potential, even in the presence of strong multiple scattering. / The new form of the boundary conditions allows for a generalization of a crosssection expression for calculating inelastic images, making use of the theory of mixed dynamic form factors. This enables the simulation of images for a range of inelastic mechanisms, including thermal scattering, used to simulate high-angle annular dark field imaging, and inner-shell ionization, used to simulate electron energy loss spectroscopy images. A multislice form of this expression is given. Selection between the methods can thus be based on the sample of interest: the Bloch wave method is very efficient when the sample is crystalline; the multislice method is more appropriate if the sample lacks periodicity. / The issue of cross-talk, where dynamical probe spreading may result in a signal containing contributions from several columns and therefore confound direct interpretation, is assessed for high-angle annular dark field imaging. Single atom images are simulated to provide an estimate of the localization of signal in electron energy loss spectroscopy, and confirm that the limitations of probe size generally outweigh those of the nature of the ionization interaction. The feasibility of column-by-column spectroscopic identification is demonstrated through a combination of experimental data and supporting calculations. Data demonstrating the location and spectroscopic identification of a single impurity atom in the bulk are supported by simulation and it is demonstrated that a quantitative comparison can offer further useful information: an estimate for the depth of the impurity. / The contribution to electron energy loss spectroscopy images from electrons which have undergone thermal scattering prior to causing an inner-shell ionization event is assessed. It is concluded that this contribution is significant in strongly scattering specimens imaged using fine probes. It will be necessary to include this contribution if quantitative comparisons are to be made.

This thesis explores the theory of electron energy-loss spectroscopy (EELS) in atomic resolution electron microscopy. / The first unequivocal evidence of the effective nonlocal potential in momentum-transfer-resolved EELS is presented. For suitable geometries, the nonlocal potential can be well approximated by a local potential. In scanning transmission electron microscopy (STEM) the validity of this is mainly influenced by the detector size and, contrary to conventional wisdom, a thin annular detector does not allow direct image interpretation. It is found that the best way to ensure the potential is well approximated by a local potential is to use a detector with a large collection angle. / To simplify computation and interpretation it is desirable to make the single-channelling approximation. In this approximation only the elastic scattering of the probe before the ionisation event is modelled. It is shown how this approximation breaks down for the small detectors used in momentum-transfer-resolved EELS and this is confirmed with experimental results. Double-channelling calculations, where the channelling of the probe both before and after the ionisation event are modelled, can also be simulated. An alternative approximation for small detectors that includes double channelling and is more applicable for momentum-transfer-resolved EELS is also presented. / Beyond chemical information, the fine structure of an absorption edge gives bonding and electronic information. Incorporating fine structure into channelling theory allows the exploration of the effects of channelling on fine structure. The weighting of the two different spectra in graphite, as a function of incident probe tilt in momentum-transfer-resolved EELS, is calculated using double-channelling simulations. This is combined with experimental data and multivariate statistical analysis to extract the two physical spectra, greatly simplifying the analysis of a large data set. / The effect of the nonlocal potential and channelling on site-specific electronic structure analysis by channelling EELS is examined. It is found that using a large on-axis detector can make the interaction effectively local, leading to a greater change in the spectra as a function of sample tilt. Alternatively offsetting the detector can achieve similar results but at the cost of greater statistical noise. Channelling calculations were combined with the program FEFF and the full energy differential cross section was calculated from first principles for the aluminium K edge as a function of sample tilt in nickel aluminate spinel. Qualitative agreement with experiment was found but quantitative agreement will require further investigation. / The theory of fine structure in STEM was examined, using strontium titanate to see how the high spatial resolution of STEM can be used in conjunction with energy-loss near-edge spectroscopy measurements. The possibility of imaging unoccupied electron molecular orbitals using STEM was also examined.

abstract: Topological insulators with conducting surface states yet insulating bulk states have generated a lot of interest amongst the physics community due to their varied characteristics and possible applications. Doped topological insulators have presented newer physical states of matter where topological order co&ndashexists; with other physical properties (like magnetic order). The electronic states of these materials are very intriguing and pose problems and the possible solutions to understanding their unique behaviors. In this work, we use Electron Energy Loss Spectroscopy (EELS) – an analytical TEM tool to study both core&ndashlevel; and valence&ndashlevel; excitations in Bi2Se3 and Cu(doped)Bi2Se3 topological insulators. We use this technique to retrieve information on the valence, bonding nature, co-ordination and lattice site occupancy of the undoped and the doped systems. Using the reference materials Cu(I)Se and Cu(II)Se we try to compare and understand the nature of doping that copper assumes in the lattice. And lastly we utilize the state of the art monochromated Nion UltraSTEM 100 to study electronic/vibrational excitations at a record energy resolution from sub-nm regions in the sample. / Dissertation/Thesis / M.S. Materials Science and Engineering 2013

Abstract Experimental synchrotron radiation induced electron- and ion spectroscopies together with electron-ion and ion-ion coincidence techniques as well as electron energy loss spectroscopy have been used to study the electronic properties of several vapor phase samples. In this thesis studies of the electronic structure and fragmentation of Sb4 clusters, photo- and Auger electron spectroscopy of atomic Si and Pb as well as ultra high resolution VUV absorption of vapor phase KF molecules have been performed. The instrumentation and techniques used in the studies, especially the electron energy loss apparatus and the newly built ultra high resolution FINEST beamline branch, are presented.

Graphene, a one-atom thick sheet of carbon, is the thinnest, strongest and most electrically conductive material ever discovered. Alongside carbon nanotubes it is part of the group of nanocarbons whose unique properties have sparked huge interest in possible applications, including electronic devices, solar cells and biosensors. Doping of these materials allows for the modification of their optical and electronic properties,which is crucial to realising these applications. Studying the properties of these doped materials at atomic resolution and finding controllable and industrially scalable routes to doping, such as low energy ion implantation, are thus essential if they are to becomethe materials of the future. In this thesis, highly localised optical enhancements in metal doped graphene are studied using energy-filtered transmission electron microscopy in a monochromated and aberration corrected electron microscope. The ideal conditions for imaging the low energy loss region of graphene using EFTEM are discussed and new methods to compensate for image artifacts when using this technique at high resolution are presented. Density functional theory is used to reveal new visible spectrum plasmon excitations in the electron energy loss spectra of boron and nitrogen doped nanocarbons. Atomic resolution scanning transmission electron microscopy and nanoscale electron energy loss spectroscopy are used to investigate controllable and defect-free substitutional doping of suspended graphene films through low energy ion implantation. Computational methods for filtering high angle annular dark field images are shown and software for the automated processing and spectroscopic analysis of these images is developed.

Scanning transmission electron microscopy is one of the essential techniques suitable not only for imaging of nanostructures, but also for various kinds of spectroscopy and, as it was recently demonstrated, nanomanipulation. In this thesis, we deal with an interaction of fast electrons and metallic spherical nanoparticles, specifically aluminium and gold nanospheres. First, we present both analytical and numerical calculations of electron energy loss spectra and their analysis for different parameters. The main part of the thesis is devoted to theoretical calculations of forces acting on the nanosphere due to the electron passing in its close proximity. Based on our novel results revealing a time evolution of the mechanical force, we also propose a possible mechanism responsible for the nanoparticle movement in electron microscopes.