Recent advances in nano technology have opened doors to several next generation devices and sensors. Characterizing nano particles and structures in a simple and effective way is imperative for monitoring and detecting processes at nano scale in a variety of environments. In recent years, the problem of studying nano particle interactions with surface plasmons or evanescent waves has gained significant interest. Here, a numerical model is presented to characterize nano-size particles and agglomerates near a metal or a dielectric interface. The methodology is based on a hybrid method, where the T-matrix approach is coupled with the image theory. The far field scattering patterns of single particles and agglomerates subjected to surface plasmons/evanescent waves are obtained. The approach utilizes the vector spherical harmonics for the incident and scattered fields relating them through a T-matrix. Effects of size, shape and orientation of the cluster on their scattering patterns are studied. An effort is made to distinguish particle characteristics from the scattering information obtained at certain observation angles. Understanding these scattering patterns is critical for the design of sensors using the surface plasmon scattering technique to monitor nano self assembly processes

In this effort a new measurement technique for the lateral Goos-Hanchen shift is developed, analyzed, and demonstrated. The new technique uses classical image formation methods fused with modern detection and analysis methods to achieve higher levels of sensitivity than obtained with prior practice. Central to the effort is a new mathematical model of the dispersion seen at a step shadow when the Goos-Hanchen effect occurs near critical angle for total internal reflection. Image processing techniques are applied to measure the intensity distribution transfer function of a new divergence model of the Goos-Hanchen phenomena providing verification of the model. This effort includes mathematical modeling techniques, analytical derivations of governing equations, numerical verification of models and sensitivities, optical design of apparatus, image processing

Nesse trabalho, propomos uma modificação da técnica de caracterização de filmes conhecida por m-line para o desenvolvimento de um refratômetro para gases e líquidos. O principio dessa técnica consiste no acoplamento de ondas evanescentes em guias de ondas planares obtidos via o fenômeno da reflexão total interna frustrada através de dispositivos acopladores. Observa-se experimentalmente, após incidir um feixe de laser contínuo na base do acoplador óptico, uma grande atenuação da radiação refletida para determinados ângulos de incidência, que é justamente a radiação acoplada nos modos permitidos pelo guia de onda. Medindo-se os valores desses ângulos e usando a teoria de acoplamento, é possível determinar as características desconhecidas do sistema. Esse sistema consiste de um acoplador óptico semicircular de alto índice de refração em cuja base foram depositados, via evaporação, um filme de dióxido de silício (SiO2) e outro de dióxido de zircônio (ZrO2). Ou seja, o sistema resume-se a dois meios finitos (filmes) prensados entre dois meios semi-infinitos (prisma e amostra). Como a espessura dos filmes e os índices de refração complexos dos filmes e do prisma são conhecidos, a única variável é o índice de refração do quarto meio, que é a amostra da qual se deseja medir o índice de refração. Estudamos a influência que cada um dos parâmetros externos exerce sobre o perfil refletido, tais como comprimento de onda e polarização da radiação incidente, espessuras e índices de refração dos filmes e o formato dos dispositivos acopladores. Descrevemos o comportamento do sistema quando o feixe incidente possui perfil gaussiano, que é perfil dos lasers usualmente usados em pesquisa. As espessuras das camadas de SiO2 e de ZrO2 foram otimizadas tendo em vista a faixa dos valores do índice de refração das amostras que se deseja medir. A otimização do sistema é obtida via teoria de guiamento de radiação em guias de ondas planares para o caso de quatro meios. Para a aquisição e tratamento dos dados desenvolvemos um programa na plataforma LabVIEW® que processa a imagem detectada por uma câmera CCD no visível, possibilitando o acompanhamento da variação do feixe refletido em função da variação do índice de refração da amostra. Assim, além de determinar ponto a ponto a variação do perfil refletido, é possível determinar a dinâmica em que esse efeito se realiza, gerando possibilidades de aplicação da técnica em áreas relacionadas à dinâmica química e bioquímica. Para confirmação da efetividade da técnica, realizamos medidas da variação do índice de refração do ar em função da umidade relativa, temperatura, pressão e para soluções de glicose. O sistema demonstrou sensitividade suficiente para acompanhar mudanças do índice de refração do ar da ordem de 10-6. / In this work, we propose a modification of the technique for characterization of films known as the m-line for the development of a refractometer for liquids and gases. The principle of this technique is coupling evanescent waves in planar waveguides obtained by the phenomenon of frustrated total internal reflection devices through devices couplers. It is experimentally observed, after focusing a continuous laser beam at the base of the coupler, a large attenuation of the reflected radiation for certain angles of incidence, which is precisely the radiation coupled in the modes allowed by the waveguide. Measuring the values of these angles and using the coupling theory, it is possible to determine the unknown characteristics of the system. This system consists of a semicircular optocoupler high refractive index which in the base was deposited, via evaporation, a film of silicon dioxide (SiO2) and a zirconium dioxide (ZrO2). In other words, the system is similar to a two finite media (films) pressed between two semi-infinite media (prism and sample). As the film thickness and complex refractive indices of the film and the prism are known, the only variable is the index of refraction of the fourth medium that is the sample from which it is aimed to measure the refractive index. We studied the influence that each of the external parameters has on the reflected profile, such as wavelength and polarization of the incident radiation, thicknesses and refractive indices of the films and the format of the devices couplers. We describe the system behavior when the incident beam has a Gaussian profile, which is usually the profile of the lasers usually used in researches. The thicknesses of the layers of SiO2 and ZrO2 were optimized in function of the range of the refractive index values of the samples to be measured. System optimization is obtained via the guiding theory of radiation in planar waveguides for the case of four mediums. For acquisition and data processing, a program were developed in LabVIEW® platform that processes the image detected by a CCD camera in visible light, allowing us to relate the variation of the reflected beam to the value of the refractive index of the sample. Thus, besides determining the variation of the profile reflected, it is possible to determine the dynamic in which this effect takes place, generating opportunities for application of the technique in areas related to the dynamic chemistry and biochemistry. To confirm the effectiveness of the technique, we performed measurements of the variation of the refractive index of air as a function of relative humidity, temperature, pressure and glucose solutions. The system shows sufficient sensitivity to follow changes in the refractive index of air in the order of 10-6.

The technique of single particle Total Internal Reflection Microscopy (TIRM) has been used to study the scattering intensity from levitated microspheres. TIRM can be used to monitor the separation between microscopic spheres immersed in liquid (water in our case) and a surface with nm resolution. In the technique, microspheres scatter light when the evanescent waves are incident upon them. The intensity of the scattered light is directly related to the height above the surface and allows determination of the height. From the separation distance histograms, the interaction between the microsphere and interface may be characterized with a force resolution in the range of 0.01 picoNewtons. Such a system can be applied to the measurement of biomolecular interactions biomolecules attached to the microsphere and the surface. The intensity and scattering pattern of this light has been modeled using a modified Mie theory which accounts for the evanescent nature of the incident light. Diffusing Colloidal Probe Microscopy (DCPM) is an extension of the TIRM technique that simultaneously monitors multiple microsphere probes. The use of multiple probes introduces the issue of probe polydispersity. When measured at the surface, a variation in scattered light intensity of nearly one order of magnitude has been observed from a purchased microsphere sample. Thus the polydisperse collection of microspheres adds significant complexity to the scattered light signal. It is hypothesized that the dependence of the total scattered light intensity on microsphere size accounts for the scattered intensity distribution in a polydisperse microsphere sample. Understanding this variation in the scattered light with microsphere size will allow improved characterization of the microsphere/surface separation. Additionally, larger microspheres have the ability to resonantly confine light and produce spectrally narrow Whispering Gallery Modes (WGMs). It is hypothesized that WGMs may be excited in microspheres with the DCPM system. These modes may be used as a refractometric biosensor with high sensitivity to local refractive index changes on the surface of the microsphere. This research involves modeling scattered intensity distributions for polydispersed collections of microspheres based on modified Mie theory. The theoretical results are compared to experimentally obtained results and found to qualitatively explain the scattered light intensity distribution in a multiple probe DCPM system. This is an important result suggesting that microsphere size variation plays a major role in determining the distribution of scattered intensity in multiple microsphere probe systems. This work also suggests that it may be possible to excite such WGMs in a DCPM system. The introduction of WGMs would enable refractometric biosensing in such evanescent mode systems.

The technique of single particle Total Internal Reflection Microscopy (TIRM) has been used to study the scattering intensity from levitated microspheres. TIRM can be used to monitor the separation between microscopic spheres immersed in liquid (water in our case) and a surface with nm resolution. In the technique, microspheres scatter light when the evanescent waves are incident upon them. The intensity of the scattered light is directly related to the height above the surface and allows determination of the height. From the separation distance histograms, the interaction between the microsphere and interface may be characterized with a force resolution in the range of 0.01 picoNewtons. Such a system can be applied to the measurement of biomolecular interactions biomolecules attached to the microsphere and the surface. The intensity and scattering pattern of this light has been modeled using a modified Mie theory which accounts for the evanescent nature of the incident light. Diffusing Colloidal Probe Microscopy (DCPM) is an extension of the TIRM technique that simultaneously monitors multiple microsphere probes. The use of multiple probes introduces the issue of probe polydispersity. When measured at the surface, a variation in scattered light intensity of nearly one order of magnitude has been observed from a purchased microsphere sample. Thus the polydisperse collection of microspheres adds significant complexity to the scattered light signal. It is hypothesized that the dependence of the total scattered light intensity on microsphere size accounts for the scattered intensity distribution in a polydisperse microsphere sample. Understanding this variation in the scattered light with microsphere size will allow improved characterization of the microsphere/surface separation. Additionally, larger microspheres have the ability to resonantly confine light and produce spectrally narrow Whispering Gallery Modes (WGMs). It is hypothesized that WGMs may be excited in microspheres with the DCPM system. These modes may be used as a refractometric biosensor with high sensitivity to local refractive index changes on the surface of the microsphere. This research involves modeling scattered intensity distributions for polydispersed collections of microspheres based on modified Mie theory. The theoretical results are compared to experimentally obtained results and found to qualitatively explain the scattered light intensity distribution in a multiple probe DCPM system. This is an important result suggesting that microsphere size variation plays a major role in determining the distribution of scattered intensity in multiple microsphere probe systems. This work also suggests that it may be possible to excite such WGMs in a DCPM system. The introduction of WGMs would enable refractometric biosensing in such evanescent mode systems.

The technique of single particle Total Internal Reflection Microscopy (TIRM) has been used to study the scattering intensity from levitated microspheres. TIRM can be used to monitor the separation between microscopic spheres immersed in liquid (water in our case) and a surface with nm resolution. In the technique, microspheres scatter light when the evanescent waves are incident upon them. The intensity of the scattered light is directly related to the height above the surface and allows determination of the height. From the separation distance histograms, the interaction between the microsphere and interface may be characterized with a force resolution in the range of 0.01 picoNewtons. Such a system can be applied to the measurement of biomolecular interactions biomolecules attached to the microsphere and the surface. The intensity and scattering pattern of this light has been modeled using a modified Mie theory which accounts for the evanescent nature of the incident light. Diffusing Colloidal Probe Microscopy (DCPM) is an extension of the TIRM technique that simultaneously monitors multiple microsphere probes. The use of multiple probes introduces the issue of probe polydispersity. When measured at the surface, a variation in scattered light intensity of nearly one order of magnitude has been observed from a purchased microsphere sample. Thus the polydisperse collection of microspheres adds significant complexity to the scattered light signal. It is hypothesized that the dependence of the total scattered light intensity on microsphere size accounts for the scattered intensity distribution in a polydisperse microsphere sample. Understanding this variation in the scattered light with microsphere size will allow improved characterization of the microsphere/surface separation. Additionally, larger microspheres have the ability to resonantly confine light and produce spectrally narrow Whispering Gallery Modes (WGMs). It is hypothesized that WGMs may be excited in microspheres with the DCPM system. These modes may be used as a refractometric biosensor with high sensitivity to local refractive index changes on the surface of the microsphere. This research involves modeling scattered intensity distributions for polydispersed collections of microspheres based on modified Mie theory. The theoretical results are compared to experimentally obtained results and found to qualitatively explain the scattered light intensity distribution in a multiple probe DCPM system. This is an important result suggesting that microsphere size variation plays a major role in determining the distribution of scattered intensity in multiple microsphere probe systems. This work also suggests that it may be possible to excite such WGMs in a DCPM system. The introduction of WGMs would enable refractometric biosensing in such evanescent mode systems.

The technique of single particle Total Internal Reflection Microscopy (TIRM) has been used to study the scattering intensity from levitated microspheres. TIRM can be used to monitor the separation between microscopic spheres immersed in liquid (water in our case) and a surface with nm resolution. In the technique, microspheres scatter light when the evanescent waves are incident upon them. The intensity of the scattered light is directly related to the height above the surface and allows determination of the height. From the separation distance histograms, the interaction between the microsphere and interface may be characterized with a force resolution in the range of 0.01 picoNewtons. Such a system can be applied to the measurement of biomolecular interactions biomolecules attached to the microsphere and the surface. The intensity and scattering pattern of this light has been modeled using a modified Mie theory which accounts for the evanescent nature of the incident light. Diffusing Colloidal Probe Microscopy (DCPM) is an extension of the TIRM technique that simultaneously monitors multiple microsphere probes. The use of multiple probes introduces the issue of probe polydispersity. When measured at the surface, a variation in scattered light intensity of nearly one order of magnitude has been observed from a purchased microsphere sample. Thus the polydisperse collection of microspheres adds significant complexity to the scattered light signal. It is hypothesized that the dependence of the total scattered light intensity on microsphere size accounts for the scattered intensity distribution in a polydisperse microsphere sample. Understanding this variation in the scattered light with microsphere size will allow improved characterization of the microsphere/surface separation. Additionally, larger microspheres have the ability to resonantly confine light and produce spectrally narrow Whispering Gallery Modes (WGMs). It is hypothesized that WGMs may be excited in microspheres with the DCPM system. These modes may be used as a refractometric biosensor with high sensitivity to local refractive index changes on the surface of the microsphere. This research involves modeling scattered intensity distributions for polydispersed collections of microspheres based on modified Mie theory. The theoretical results are compared to experimentally obtained results and found to qualitatively explain the scattered light intensity distribution in a multiple probe DCPM system. This is an important result suggesting that microsphere size variation plays a major role in determining the distribution of scattered intensity in multiple microsphere probe systems. This work also suggests that it may be possible to excite such WGMs in a DCPM system. The introduction of WGMs would enable refractometric biosensing in such evanescent mode systems.

Nesse trabalho, propomos uma modificação da técnica de caracterização de filmes conhecida por m-line para o desenvolvimento de um refratômetro para gases e líquidos. O principio dessa técnica consiste no acoplamento de ondas evanescentes em guias de ondas planares obtidos via o fenômeno da reflexão total interna frustrada através de dispositivos acopladores. Observa-se experimentalmente, após incidir um feixe de laser contínuo na base do acoplador óptico, uma grande atenuação da radiação refletida para determinados ângulos de incidência, que é justamente a radiação acoplada nos modos permitidos pelo guia de onda. Medindo-se os valores desses ângulos e usando a teoria de acoplamento, é possível determinar as características desconhecidas do sistema. Esse sistema consiste de um acoplador óptico semicircular de alto índice de refração em cuja base foram depositados, via evaporação, um filme de dióxido de silício (SiO2) e outro de dióxido de zircônio (ZrO2). Ou seja, o sistema resume-se a dois meios finitos (filmes) prensados entre dois meios semi-infinitos (prisma e amostra). Como a espessura dos filmes e os índices de refração complexos dos filmes e do prisma são conhecidos, a única variável é o índice de refração do quarto meio, que é a amostra da qual se deseja medir o índice de refração. Estudamos a influência que cada um dos parâmetros externos exerce sobre o perfil refletido, tais como comprimento de onda e polarização da radiação incidente, espessuras e índices de refração dos filmes e o formato dos dispositivos acopladores. Descrevemos o comportamento do sistema quando o feixe incidente possui perfil gaussiano, que é perfil dos lasers usualmente usados em pesquisa. As espessuras das camadas de SiO2 e de ZrO2 foram otimizadas tendo em vista a faixa dos valores do índice de refração das amostras que se deseja medir. A otimização do sistema é obtida via teoria de guiamento de radiação em guias de ondas planares para o caso de quatro meios. Para a aquisição e tratamento dos dados desenvolvemos um programa na plataforma LabVIEW® que processa a imagem detectada por uma câmera CCD no visível, possibilitando o acompanhamento da variação do feixe refletido em função da variação do índice de refração da amostra. Assim, além de determinar ponto a ponto a variação do perfil refletido, é possível determinar a dinâmica em que esse efeito se realiza, gerando possibilidades de aplicação da técnica em áreas relacionadas à dinâmica química e bioquímica. Para confirmação da efetividade da técnica, realizamos medidas da variação do índice de refração do ar em função da umidade relativa, temperatura, pressão e para soluções de glicose. O sistema demonstrou sensitividade suficiente para acompanhar mudanças do índice de refração do ar da ordem de 10-6. / In this work, we propose a modification of the technique for characterization of films known as the m-line for the development of a refractometer for liquids and gases. The principle of this technique is coupling evanescent waves in planar waveguides obtained by the phenomenon of frustrated total internal reflection devices through devices couplers. It is experimentally observed, after focusing a continuous laser beam at the base of the coupler, a large attenuation of the reflected radiation for certain angles of incidence, which is precisely the radiation coupled in the modes allowed by the waveguide. Measuring the values of these angles and using the coupling theory, it is possible to determine the unknown characteristics of the system. This system consists of a semicircular optocoupler high refractive index which in the base was deposited, via evaporation, a film of silicon dioxide (SiO2) and a zirconium dioxide (ZrO2). In other words, the system is similar to a two finite media (films) pressed between two semi-infinite media (prism and sample). As the film thickness and complex refractive indices of the film and the prism are known, the only variable is the index of refraction of the fourth medium that is the sample from which it is aimed to measure the refractive index. We studied the influence that each of the external parameters has on the reflected profile, such as wavelength and polarization of the incident radiation, thicknesses and refractive indices of the films and the format of the devices couplers. We describe the system behavior when the incident beam has a Gaussian profile, which is usually the profile of the lasers usually used in researches. The thicknesses of the layers of SiO2 and ZrO2 were optimized in function of the range of the refractive index values of the samples to be measured. System optimization is obtained via the guiding theory of radiation in planar waveguides for the case of four mediums. For acquisition and data processing, a program were developed in LabVIEW® platform that processes the image detected by a CCD camera in visible light, allowing us to relate the variation of the reflected beam to the value of the refractive index of the sample. Thus, besides determining the variation of the profile reflected, it is possible to determine the dynamic in which this effect takes place, generating opportunities for application of the technique in areas related to the dynamic chemistry and biochemistry. To confirm the effectiveness of the technique, we performed measurements of the variation of the refractive index of air as a function of relative humidity, temperature, pressure and glucose solutions. The system shows sufficient sensitivity to follow changes in the refractive index of air in the order of 10-6.

This dissertation presents a free-space, long-range, passive optical communication system that uses electrostatically modulated microelectromechanical systems (MEMS) structures coupled with a glass total internal reflection (TIR)-type corner cube retroreflector (CCR) as a non-emitting data transmitter. A CCR consists of three mirrors orthogonal to each other, so that the incident beam is reflected back to the incident beam, source. The operational concept is to have a MEMS modulator fusion with TIR CCR, such that the modulators are working periodically to disrupt the evanescent waves at the air interface of one of the three back glass faces of a TIR CCR. The MEMS chip has two primary components: (1) an array of movable light scattering silicon structures with nano roughness and (2) a glass lid with a transparent conductive indium tin oxide (ITO) film. The MEMS structures are bonded to a glass lid using flip-chip bonding. Once bonded, the MEMS structures can be modulated either toward or away from the glass lid, thus disrupting evanescent energy delivered from a probing laser beam. The MEMS structure is precisely bonded to the TIR CCR with an accuracy of 10-30 arc-seconds using a Michelson interferometry feedback system. This is a novel step by which an existing passive commercial CCR can be converted into a modulating active CCR. This CCR-MEMS unit acts as the key element of the transmitter. To illustrate the concept of a low-power, unattended, sensor-monitoring system, we developed a sensor board containing temperature, humidity, and magnetic sensors along with a microprocessor and other electronics. The sensor board and CCR board are packed together and act as the transmitter unit. We developed a benchtop system and an improved portable receiver system. The receiver system contains the laser (as source), a collimating lens (to collect retroreflected signal), an optical, narrow band pass filter, and a detector. The detector signal was amplified and filtered and sent either to the oscilloscope, a lock-in-amplifier, or a laptop to display the sensor data. Using the receiver system, a sensor-CCR-based transmitter unit, and receiver with 635 nm as source, we achieved retroreflective communication over a distance of 300 m.

The development of micro and nanoelectronics and nanophotonics needs novel characterization techniques to ensure higher quality of designed devices. The thesis describes a use of Scanning Near-field Optical Microscopy (SNOM) in dimensional control and in local investigation of diverse physical parameters. As example of its potential, the correlation between object topography and reflection measurement of capacitors is shown.