- About
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The Global ETD Search service is a free service for researchers
to find electronic theses and dissertations. This service is
provided by the
Networked Digital Library of Theses and Dissertations.
Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
Search results
Showing 381 to 390 of 763 (0.038 seconds)Spelling suggestions: "subject:"fieldeffect"" "subject:"fields:effect""
| 381 |
Modeling of the dual-gate GaAs MESFET /Ibrahim, Mostafa M. January 1900 (has links)
Thesis (Ph. D.)--Carleton University, 2003. / Includes bibliographical references (p. 162-169). Also available in electronic format on the Internet.
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| 382 |
Hot carrier induced degradation and gamma radiation induced degradation in SiGe HBTs and VCOs /Gill, Coralie R. January 1900 (has links)
Thesis (M. App. Sc.)--Carleton University, 2004. / Includes bibliographical references (p. 72-75). Also available in electronic format on the Internet.
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| 383 |
Broadband modelling of high-frequency devices and circuits /Paul, Douglas January 1900 (has links)
Thesis (M.App.Sc.) - Carleton University, 2006. / Includes bibliographical references (p. 103-107). Also available in electronic format on the Internet.
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| 384 |
Total ionizing dose mitigation by means of reconfigurable FPGA computing /Smith, Farouk. January 2007 (has links)
Dissertation (PhD)--University of Stellenbosch, 2007. / Bibliography. Also available via the Internet.
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| 385 |
Intelligent gate drive for high power MOSFETs and IGBTsChen, Lihua. January 2008 (has links)
Thesis (Ph. D.)--Michigan State University. Dept. of Electrical and Computer Engineering, 2008. / Title from PDF t.p. (viewed on July 23, 2009) Includes bibliographical references (p. 243-252). Also issued in print.
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| 386 |
Large signal electro-thermal LDMOSFET modeling and the thermal memory effects in RF power amplifiersDai, Wenhua, January 2004 (has links)
Thesis (Ph. D.)--Ohio State University, 2004. / Title from first page of PDF file. Document formatted into pages; contains xix, 156 p.; also includes graphics (some col.). Includes bibliographical references (p. 152-156).
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| 387 |
A study on the material and device characteristics of hafnium oxynitride MOSFETs with TaN gate electrodesKang, Changseok, Lee, Jack Chung-Yeung, January 2004 (has links) (PDF)
Thesis (Ph. D.)--University of Texas at Austin, 2004. / Supervisor: Jack C. Lee. Vita. Includes bibliographical references. Also available from UMI.
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| 388 |
A study of the performance and reliability characteristics of HfO₂ MOSFET's with polysilicon gate electrodesOnishi, Katsunori. January 2002 (has links) (PDF)
Thesis (Ph. D.)--University of Texas at Austin, 2002. / Vita. Includes bibliographical references. Available also from UMI Company.
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| 389 |
A study of thermally nitrided silicon dioxide thin films for metal-oxide-silicon VLSI techology /Liu, Zhihong. January 1990 (has links)
Thesis (Ph. D.)--University of Hong Kong, 1990.
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| 390 |
Advanced transport models development for deep submicron low power CMOS device design /Wang, Haihong, January 1999 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 1999. / Vita. Includes bibliographical references (leaves 140-149). Available also in a digital version from Dissertation Abstracts.
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