No description available.

<p dir="ltr">This work focuses on creating a cost-effective and accessible radiation testbed within Purdue University’s sub-critical pile. The testbed is designed to assess the resilience of electronic systems exposed to gamma and neutron radiation, addressing challenges faced in nuclear, aerospace, and defense industries where electronics must function reliably in high-radiation environments. Traditional radiation testing facilities often pose limitations such as high costs, limited accessibility, and excessive neutron flux levels, making them unsuitable for low-to-medium flux testing. This research introduces a controlled and well-characterized radiation exposure environment that simulates real-world conditions for radiation-sensitive electronics, including the Defense Threat Reduction Agency’s (DTRA) Scatterable Radiation Monitor (SCRAM). The methodology includes mechanical and electronic testbed construction, radiation flux characterization using gold foil activation experiments, and real-time electronic performance assessments under radiation exposure. By leveraging Purdue’s sub-critical pile and PUR-1 reactor, the testbed offers a versatile platform for radiation hardness testing, filling a crucial gap in existing testing infrastructure. The findings validate the effectiveness of the testbed in providing moderate neutron and gamma flux environments, ensuring more reliable performance testing of radiation-hardened electronics. The study contributes to the development of standardized radiation testing methodologies and highlights the potential for broader applications in nuclear safety, environmental monitoring, and space electronics.</p>