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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

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1

Qualitative and Quantative Characterization of Trapping Effects in AlGaN/GaN High Electron Mobility Transistors

Kim, Hyeong Nam 28 September 2009 (has links)
No description available.
Electrical Engineering
AlGaN/GaN HEMT
trapping effects
electron trapping
HEMT model
device parameter extraction
drift velocity

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