• Refine Query
  • Source
  • Publication year
  • to
  • Language
  • 2
  • Tagged with
  • 2
  • 2
  • 2
  • 2
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
1

Genetic mapping of QTL for Fusarium head blight resistance in winter wheat cultivars Art and Everest

Clinesmith, Marshall January 1900 (has links)
Master of Science / Agronomy / Allan Fritz / Fusarium head blight (FHB) is a fungal disease, mostly commonly associated with F. graminearum, which affects cereal crops such as wheat resulting in substantial yield losses and reductions in grain quality. The onset of the disease can occur rapidly when warm, wet or humid weather coincides with flowering in the spring. The pathogen also produces mycotoxins such as deoxynivalenol (DON) that accumulate in the grain and can be toxic to humans and animals. This results in additional economic losses as contaminated grain must be discarded or blended to reduce the amount of toxin in order to meet federal regulatory limits. Development and deployment of resistant cultivars has proved to be an effective method to combat the disease, and many resistant sources have been reported in the literature with the majority of major resistance coming from Chinese landraces. Transferring resistance from these sources into cultivars adapted to the U.S. has been a slow process due to linkage of FHB resistance genes with poor agronomic traits. Therefore, it is important for breeders to search for sources of resistance in native material adapted to their local conditions. In this study, we aimed to identify quantitative trait loci (QTL) for resistance to spread of FHB within the head (Type II resistance), accumulation of DON toxin in grain (Type III resistance), and resistance to kernel infection (Type IV resistance). Plant material consisted of 148 doubled haploid (DH) lines from a cross between the two moderately resistant hard red winter wheat (HRWW) cultivars Art and Everest. The study was conducted for two years using a point inoculation technique in a greenhouse in Manhattan, KS. Three QTL conferring resistance to FHB traits were detected on chromosomes 2D, 4B, and 4D. The QTL on chromosomes 4B and 4D overlapped with the major height genes Rht1 and Rht2, respectively. Plant height has shown previous associations with FHB, though the underlying cause of these associations is not well understood. The majority of results have reported increased susceptibility associated with shorter plant types; however, in this study, the haplotype analysis for the Rht-B1 and Rht-D1 loci showed an association between the dwarfing alleles and increased resistance to FHB. This suggests either pleiotropic effects of these loci or perhaps linkage with nearby genes for FHB resistance. Markers close to the peaks of the FHB resistance QTL have the potential for Kompetitive Allele Specific PCR (KASP) marker development and subsequent use in marker assisted selection (MAS) to help improve overall FHB resistance within breeding programs.
2

Quantifying yield losses due to barley yellow dwarf on winter wheat in Kansas using disease phenotypic data

Gaunce, Genna Marie January 1900 (has links)
Master of Science / Department of Plant Pathology / William Bockus / Barley yellow dwarf (BYD) is one of the most important wheat diseases in the state of Kansas. Despite the development of cultivars with improved levels of resistance to BYD, little is known about the impact that this resistance has on yield loss from the disease. The intent of this research was to estimate yield loss in winter wheat cultivars in Kansas due to BYD and quantify the reduction in losses associated with resistant cultivars. During seven years, BYD disease incidence was visually assessed on numerous winter wheat cultivars in replicated field nurseries. Cultivars were planted about three weeks early to promote disease. When grain yields were regressed against BYD incidence scores, negative linear relationships significantly fit the data for each year and for the combined dataset covering all seven years. The models showed that, depending upon the year, 19-48% (average 33%) of the yields was explained by BYD incidence. For the combined dataset, 29% of the relative yield was explained by BYD incidence. The models predicted that cultivars showing high disease incidence had 25-86% (average 49%) less yield than a hypothetical cultivar that showed zero incidence. Using the models, the moderate level of resistance in the cultivar Everest was calculated to reduce yield loss from BYD by about 73%. Therefore, utilizing visual BYD symptom evaluations in Kansas, coupled with grain yields, is useful to estimate yield loss from the disease. Furthermore, linear models that incorporate those parameters can be used to calculate the impact of improving cultivar resistance to BYD on yield losses.

Page generated in 0.0724 seconds