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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

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Spelling suggestions: "subject:"entegrated circuits aadiation hardening."" "subject:"entegrated circuits eradiation hardening.""

1

A built-in self test (BIST) technique for single-event transient testing in digital circuits

Balasubramanian, Anitha, January 2008 (has links)
Thesis (M. S. in Electrical Engineering)--Vanderbilt University, Aug. 2008. / Title from title screen. Includes bibliographical references.
Integrated circuits Radiation hardening.

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