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Theoretical analysis of optical mixing at interfacesMatson, Bradley S. 31 August 1998 (has links)
Graduation date: 1999
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The stability of interfaces between dissimilar materials /Leskovar, Michael. January 1998 (has links)
Thesis (Ph. D.)--University of Washington, 1998. / Vita. Includes bibliographical references (leaves [127]-130).
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Molecular structure at aqueous solution - silica interfaces and nanoindentation atomic force microscopy studies of kerogen /Zeszotarski, Jonathan C., January 2005 (has links)
Thesis (Ph. D.)--Lehigh University, 2005. / Includes vita. Includes bibliographical references (leaves 94-97).
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The study of molecular band offsets at the heteromolecular interfaceXiao, Jie. January 2009 (has links)
Thesis (Ph.D.)--University of Nebraska-Lincoln, 2009. / Title from title screen (site viewed January 5, 2010). PDF text: vii, 129 p. : ill. (some col.) ; 3 Mb. UMI publication number: AAT 3360091. Includes bibliographical references. Also available in microfilm and microfiche formats.
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Molecular structures at the surfaces of self-assembled monolayers and polymer thin films /Liu, Yi, January 2002 (has links)
Thesis (Ph. D.)--Lehigh University, 2003. / Includes bibliographical references and vita.
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Effect of interfacial friction on adhesion /Zhang Newby, Bi-min, January 1998 (has links)
Thesis (Ph. D.)--Lehigh University, 1999. / Includes vita. Includes bibliographical references.
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Investigation of surface states and device surface charging in nitride materials using scanning Kelvin probe microscopySabuktagin, Mohammed Shahriar January 1900 (has links)
Thesis (Ph.D.) -- Virginia Commonwealth University, 2005. / Title from title-page of electronic thesis. Prepared for: Dept. of Electrical Engineering. Bibliography: p. 93-97.
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Modeling of the Surface Plasmon Resonance (SPR) Effect for a Metal-Semiconductor (M-S) Junction at Elevated TemperaturesSanchez, Erik De Jesus 02 November 1993 (has links)
The effect of temperature increase on the optical excitation of Surface Plasmon Resonance (SPR) at an Ag-Si metal-semiconductor (M-S) junction at a wavelength of 1 . 1 52 pm is investigated theoretically using computer modeling in Fortran. In order to accurately quantify the SPR, the temperature dependent optical constants for Ag and Si are obtained theoretically or semiempirically , using a Drude model for Ag and previous experimentally determined equations for Si (the behavior of the optical constants for crystalline Si and doped Si are found to have very little deviation between each other for our case). An improvement in the theoretical derivation for the optical constants of Ag is obtained, maintaining self-consistency. The optical constants are utilized to quantify the reflectance of an incident wave on an M-S junction, using Fresnel equations for a four layer system. The reflectivity of the M-S junction is indicative of the surface plasmon generation. There exists much industrial interest in increasing the amount of photocurrent generation in semiconductors for a given number of incident photons. This increase in photocurrent is often referred to as enhancing the quantum efficiency (Q). It has been previously shown by many groups that there can be an appreciable enhancement of Q due to the optical excitation of surface plasmons on a Schottky barrier junction (M-S junction), although all these previous studies were done at room temperature. Hence, the studies of temperature effect of SPR at the M-S junction could lead to interesting effects for the Q as well. In this thesis, we have studied qualitatively the effect of temperature increase on the optical excitation of SPR at an Ag-Si junction. From these results we have attempted to draw inference to the possibility of the enhancement of Q at elevated temperatures for such a diode junction.
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Phase transitions of long-chain n-alkanes at interfacesMaeda, Nobuo. January 2001 (has links)
No description available.
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Study of interfacial phenomena in thin films using photoelectron spectroscopyMathew, Anoop. January 2006 (has links)
Thesis (M.M.S.E.)--University of Delaware, 2006. / Principal faculty advisor: Robert L. Opila, Dept. of Materials Science. Includes bibliographical references.
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