A common path interferometer utilizing noncritically phase matched frequency doubling crystals is presented. The interference pattern is directly sensitive to the wavefront shape (like that of a Mach Zender) and is in the second harmonic of the laser source. This interferometer has twice the sensitivity of a two beam interferometer. All the optics are 100% transmitting (i.e. no beam splitters), the contrast is adjustable, and the laser intensity pattern is not affected by the interferometer. This interferometer is similar in some ways to the Point Diffraction interferometer, and the two are compared in this paper. A theory of operation is presented, though the reference wave of the interferometer is flatter than predicted. Several possible reasons for this were examined, but no discovery made.

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Thesis (M.S.)--University of Michigan, 1973. / Project completed in 1972. Degree awarded in 1973.

Thesis (M.S.)--Brigham Young University. Dept. of Physics and Astronomy, 2007. / Includes bibliographical references (p. 77-83).

Interferometry offers great scope in the study of surface topography and small surface displacements. The fundamentals of surface as encountered in engineering practice and a few of the optical methods available for the metrology of surface have been reviewed. In particular, Oblique Incidence Interferometry has been developed in detail for the study of relatively rough surfaces. The relationship between this method and the recent and more general method of holography has been explained. Some preliminary experiments were conducted to gain a feeling for the latter two methods and an oblique incidence interferometer was designed, constructed, and tested for its suitability for measuring industrial surfaces of approximately 22 inches in span from the following aspects: 1. The determination of surface topography of rough surfaces; 2. The measurement of small surface displacements; 3. The execution of forward scatter and back scatter holography for normal qualitative recording and subsequent comparison—holographic interferometry. A rough turned surface of a 12 inch diameter circular aluminium plate was examined. Small surface displacements of the same plate were measured and compared with theoretical predictions. Further holographic interferometry was performed on a turbine blade. Some of the difficulties encountered, such as the significance of diffraction effects at edges and marks on the surface and the determination of scale were studied and are discussed. Future studies on tubes and cylinders are discussed. / Applied Science, Faculty of / Mechanical Engineering, Department of / Graduate

This study provides a description of scatterplate interferometry from both a theoretical and experimental viewpoint. Although this interferometer is a relatively simple and very effective device for use in the optical shop, very little beyond a qualitative description has been previously presented. Through the use of Fourier optics and stochastic processes techniques, a more formalized theory of scatterplate interferometry is shown particularly in how the flip or inversion symmetry of the scatterplate itself affects the flip symmetry. Also described are the effects on the fringe quality produced by non laser sources as well as aberrations in the interferometer optics. Experimental verification of these aspects is shown to be in good agreement with the theory. Of interest to the shop user of this interferometer is the material presented on scatterplate fabrication. Techniques for making the conventional, "double-exposure" or "180°-type" scatterplate, are very simple to those with access to a holography lab. Additional refinements including null testing with the scatterplate and an infrared scatterplate interferometer are also described.

Thesis (M.S.)--Virginia Polytechnic Institute and State University, 1991. / Vita. Abstract. Includes bibliographical references (leaves 74-75). Also available via the Internet.

Thesis (M.Sc.) -- Memorial University of Newfoundland. / Typescript. Bibliography: leaves 63-64. Also available online.

No description available.