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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
1

Cost modelling for VLSI circuit conversion to aid testability

Miles, J. R. January 1988 (has links)
No description available.
2

DPA Resistant Logic Arrays for Security Applications

Lakkaraju, Harsha Vardhan January 2015 (has links)
No description available.
3

Demonstration of versatile nonvolatile logic gates in 28nm HKMG FeFET technology

Breyer, E. T., Mulaosmanovic, H., Slesazeck, S., Mikolajick, T. 08 December 2021 (has links)
Logic-in-memory circuits promise to overcome the von-Neumann bottleneck, which constitutes one of the limiting factors to data throughput and power consumption of electronic devices. In the following we present four-input logic gates based on only two ferroelectric FETs (FeFETs) with hafnium oxide as the ferroelectric material. By utilizing two complementary inputs, a XOR and a XNOR gate are created. The use of only two FeFETs results in a compact and nonvolatile design. This realization, moreover, directly couples the memory and logic function of the FeFET. The feasibility of the proposed structures is revealed by electrical measurements of HKMG FeFET memory arrays manufactured in 28nm technology.

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