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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

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Spelling suggestions: "subject:"lucky electron model"" "subject:"bucky electron model""

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TCAD modeling of mixed-mode degradation in SiGe HBTs

Raghunathan, Uppili Srinivasan 07 January 2016 (has links)
The objective of this work is to develop an effective TCAD based hot-carrier degradation model in predicting the damage that a SiGe HBT undergoes as it is stressed across bias, time and temperature.
SiGe HBT
Hot-carrier
Reliability modeling
Lucky electron model

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