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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

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An automatic test pattern generation in the logic gate level circuits and MOS transistor circuits at Ohio University

Lee, Hoon-Kyeu January 1986 (has links)
No description available.
Automatic Test Pattern Generation
Logic Gate Level Circuits
MOS Transistor Circuits
Ohio University

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