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Linearization and applications of the CMOS quad /Acharya, Venkatesh B., January 2009 (has links)
Thesis (Ph.D.)--University of Texas at Dallas, 2009. / Includes vita. Includes bibliographical references (leaves 132-138)
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Hierarchical test generation for CMOS circuits /Bollinger, S. Wayne, January 1992 (has links)
Thesis (Ph. D.)--Virginia Polytechnic Institute and State University, 1992. / Vita. Abstract. Includes bibliographical references (leaves 160-168). Also available via the Internet.
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The design, fabrication, and test of a CMOS operational amplifier /Sayre, Edward P. January 1990 (has links)
Thesis (M.S.)--Rochester Institute of Technology, 1990. / Typescript. Includes bibliographical references (leaf [201]).
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A 5 GHz digitally controlled synthesizer in 90nm CMOSHamon, Bill. January 2009 (has links) (PDF)
Thesis (M.S. in electrical engineering)--Washington State University, May 2009. / Title from PDF title page (viewed on July 15, 2009). "School of Electrical Engineering and Computer Science." Includes bibliographical references (p. 83-88).
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Analysis and design of reliable mixed-signal CMOS circuitsXuan, Xiangdong. January 2004 (has links) (PDF)
Thesis (Ph. D.)--Electrical and Computer Engineering, Georgia Institute of Technology, 2005. / Singh, Adit, Committee Member ; Chatterjee, Abhijit, Committee Chairl May, Gary, Committee Member ; Keezer, David, Committee Member ; Swaminathan, Madhavan, Committee Member. Vita. Includes bibliographical references.
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Low noise design techniques for radio frequency integrated circuits /Li, Xiaoyong, January 2004 (has links)
Thesis (Ph. D.)--University of Washington, 2004. / Vita. Includes bibliographical references (p. 120-126).
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Comparison and analysis of jitter in CMOS ring oscillators /Natesan, Peroly. January 1900 (has links)
Thesis (M.S.)--Oregon State University, 2004. / Typescript (photocopy). Includes bibliographical references (leaves 56-58). Also available on the World Wide Web.
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An evaluation of the electrical, material, and reliability characteristics and process viability of ZrO₂ and ZrOxNy for future generation MOS gate dielectricNieh, Renee Elizabeth. January 2002 (has links) (PDF)
Thesis (Ph. D.)--University of Texas at Austin, 2002. / Vita. Includes bibliographical references. Available also from UMI Company.
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Electrical reliability of N-Mos devices with N2O-based oxides as gate dielectrics /Zeng, Xu, January 1996 (has links)
Thesis (Ph. D.)--University of Hong Kong, 1996. / Includes bibliographical references (leaves 158-160).
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High frequency techniques for advanced MOS device characterizationWang, Yun, January 2008 (has links)
Thesis (Ph. D.)--Rutgers University, 2008. / "Graduate Program in Electrical and Computer Engineering." Includes bibliographical references (p. 189-201).
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