Thesis (M. Phil.)--University of Hong Kong, 1974. / 'Discussion of points raised in the oral examination' inserted: after p.73.

Thesis--Ph. D., University of Hong Kong. / Typewritten.

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A combined approach to the use of surface analysis techniques and X-ray diffraction has been introduced. In particular the development of the microstructure of UHV evaporated thin metallic films has been investigated with a view to clarifying influences on microstructure (particularly texture). This study has shown the wide range of experimental parameters which affect the final film structure, such as temperature, oblique incidence and substrate roughness. An automated energy dispersive X-ray diffractometer has been developed for the study of thin film texture. The required corrections for loss of intensity due to sample positioning have been developed and verified. Pole figures have been collected for erbium and nickel thin films (thickness 200-1200 nm) grown on molybdenum or glass substrates. Results for the erbium films show a substantial effect on the texture of the film, contributed by the temperature of the substrate during deposition. The texture varies from mixed fiber at low temperature, to a strong single fiber orientation at around 663 K, to mixed fiber at higher temperatures. The strong orientation at 663 K has been shown to vary from either (002) to (101) depending on as yet unknown experimental conditions. The effect of substrate roughness appears to be only in the degree of orientation and it does not affect the overall nature of the texture of the film. The texture of the nickel films shows a form of "granular epitaxy" at substrate temperatures above 300 K. The presence of tensile stress within one of these nickel thin film samples has been determined and is interpreted to give support to a proposed mode of granular epitaxy.

Thesis (M.S.)--University of Wisconsin--Madison, 1966. / eContent provider-neutral record in process. Description based on print version record. Includes bibliographical references.

Investigations are made into the properties of 20 - 600 A gold films deposited onto freshly cleaved mica substrates by high vacuum evaporation. An accurate method of determining the equivalent thickness of a film is developed by combining a radio frequency technique employing quartz crystals with direct weighing. It is found that thicknesses as low as 0.5 A can be monitored to within ± 5%. An attempt is made to improve the structure of the gold films by using rapid deposition rates (15 to 20 A per second) and by depositing the gold films on nucleating silver layers of molecular thicknesses. The effect of increasing nucleating layer thicknesses (up to 25 A) is studied by electron microscopy and d.c. resistance measurements. A critical nucleating layer thickness for silver is found to exist between 5 to 7 A. On these critical layers, gold films down to 25 A are found conducting. All the films tested show an irreversible change in conductivity with heating. Without a silver layer, continuous decrease in the conductivity of gold films is observed, the film being destroyed at 450° C. On the other hand, increasingly better conductivities are observed by heating the gold-on-silver films, and an optimum annealing temperature of about 350° C is indicated. Above this temperature the conductivity decreases; however, films are still conducting and continuous at 600° C. These films are, therefore, suitable as heat reflecting windows. D.C, and high frequency measurements (at 9.7 Gc) on gold films are given. In both cases, almost identical values of surface resistance are obtained in the range 10 to 1,000 ohms per square. A method for preparing gold film bolometer elements using interrupted deposition of gold on a nucleating silver layer is discussed. As very thin gold on silver films with high d.c. conductivities are found to have low microwave transmission coefficients, the possible application of visual protection from microwave radiation is discussed. / Applied Science, Faculty of / Electrical and Computer Engineering, Department of / Graduate

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Thesis (M.Sc.) -- University of Adelaide, Dept. of Physics, 1974.