An algorithm to reduce data from the knife edge test is given. The method is an extension of the theory of single sideband holography to second order effects. Application to phase microscopy is especially useful because a troublesome second order term vanishes when the knife edge does not attenuate the unscattered radiation probing the specimen. The algorithm was tested by simulation of an active optics system that sensed and corrected small (less than quarter wavelength) wavefront errors. Convergence to a null was quadratic until limited by detector-injected noise in signal. The best form of the algorithm used only a Fourier transform of the smoothed detector record, a filtering of the transform, an inverse transform, and an arctangent solving for the phase of the input wavefront deformation. Iterations were helpful only for a Wiener filtering of the data record that weighted down Fourier amplitudes smaller than the mean noise level before analysis. The simplicity and sensitivity of this wavefront sensor makes it a candidate for active optic control of small-angle light scattering in space. In real time optical processing a two dimensional signal can be applied as a voltage to a deformable mirror and be received as an intensity modulation at an output plane. Combination of these features may permit a real time null test. Application to electron microscopy should allow the finding of defocus, astigmatism, and spherical aberrations for single micrographs at 0.2 nm resolution, provided a combination of specimen and support membrane is used that permits some a priori knowledge. For some thin specimens (up to nearly 100 atom layers thick) the left-right symmetry of diffraction should allow reconstruction of the wave-front deformations caused by the specimen with double the bandpass used in each image.

We present the development of a far-field magneto-optical Kerr effect microscope. An inverted optical microscope was constructed to accommodate Kerr imaging and atomic force microscopy. In Kerr microscopy, magnetic structure is investigated by measuring the polarization rotation of light reflected from a sample in the presence of a magnetic field. Atomic force microscopy makes use of a probe which is scanned over a sample surface to map the topography. The design was created virtually in SolidWorks, a three-dimensional computer-aided drafting environment, to ensure compatibility and function of the various components, both commercial and custom-machined, required for the operation of this instrument. The various aspects of the microscope are controlled by custom circuitry and a field programmable gate array data acquisition card at the direction of the control code written in National Instrument LabVIEW. The microscope has proven effective for both Kerr and atomic force microscopy. Kerr images are presented which reveal the bit structure of magneto-optical disks, as are atomic force micrographs of an AFM calibration grid. Also discussed is the future direction of this project, which entails improving the resolution of the instrument beyond the diffraction limit through near-field optical techniques. Preliminary work on fiber probe designs is presented along with probe fabrication work and the system modifications necessary to utilize such probes.

This work presents a new form of microscopy, the instrument constructed to demonstrate it, the images produced and the image contrast mechanisms seen for the first time. Some of its future scientific potential is described and finally, recent work towards advancing the method is discussed. Many forms of microscopy exist, each with unique advantages. Of several broad categories that they could be grouped into, those that use particle beams have proven very generally useful for micro and nano-scale imaging, including Scanning Electron, Transmission Electron, and Ion Beam microscopes. These have the disadvantage, however, of implanting electric charges into the sample, and usually at very high energy relative to the binding energy of molecules. For most materials this modifies the sample at a small scale and as we work increasingly towards the nano-scale, this is a serious problem. The Neutral Atom Microscope (NAM) uses a beam of thermal energy (under 70 meV) non-charged atoms or molecules to probe an atomic surface. For several decades scientists have been interested in this possibility, using a focused beam. Scattering of neutral atoms provides a uniquely low-energy, surface-sensitive probe, as is known from molecular beam experiments. We have developed a new approach, operating with the sample at a close working distance from an aperture, the need for optics to focus the beam is obviated. The demonstrated, practical performance of this "Pinhole" NAM exceeds all other attempts by great lengths by many measures. The unique images resulting and contrast mechanism discoveries are described. The future potential for nano-scale resolution is shown.

An instrument, adding the capability to measure 3D volumetric chemical composition, has been constructed by me as a member of the Sánchez Nano Laboratory. The laboratory's in situ atomic force microscope (AFM) and secondary ion mass spectrometry systems (SIMS) are functional and integrated as one instrument. The SIMS utilizes a Ga focused ion beam (FIB) combined with a quadrupole mass analyzer. The AFM is comprised of a 6-axis stage, three coarse axes and three fine. The coarse stage is used for placing the AFM tip anywhere inside a (13x13x5 mm3) (xyz) volume. Thus the tip can be moved in and out of the FIB processing region with ease. The planned range for the Z-axis piezo was 60 µm, but was reduced after it was damaged from arc events. The repaired Z-axis piezo is now operated at a smaller nominal range of 18 µm (16.7 µm after pre-loading), still quite respectable for an AFM. The noise floor of the AFM is approximately 0.4 nm Rq. The voxel size for the combined instrument is targeted at 50 nm or larger. Thus 0.4 nm of xyz uncertainty is acceptable. The instrument has been used for analyzing samples using FIB beam currents of 250 pA and 5.75 nA. Coarse tip approaches can take a long time so an abbreviated technique is employed. Because of the relatively long thro of the Z piezo, the tip can be disengaged by deactivating the servo PID. Once disengaged, it can be moved laterally out of the way of the FIB-SIMS using the coarse stage. This instrument has been used to acquire volumetric data on AlTiC using AFM tip diameters of 18.9 nm and 30.6 nm. Acquisition times are very long, requiring multiple days to acquire a 50-image stack. New features to be added include auto stigmation, auto beam shift, more software automation, etc. Longer term upgrades to include a new lower voltage Z-piezo with strain-gauge feedback and a new design to extend the life for the coarse XY nano-positioners. This AFM-SIMS instrument, as constructed, has proven to be a great proof of concept vehicle. In the future it will be used to analyze micro fossils and it will also be used as a part of an intensive teaching curriculum.

The objective of this thesis is to present the fabrication of a multiphoton microscope and the underlying theory responsible for its proper functioning. A basic introduction to nonlinear optics will give the necessary knowledge to the reader to understand the optical effects involved. Femtosecond laser pulses will be presented and characterized. Each part of the microscope, their integration and the design of the microscope will be discussed. The basic concepts of laser scanning microscopy are also required to explain the design of the scanning optics. Fast scanning problems and their solutions are also briefly viewed. As a working proof, the first images taken with the microscope will be presented. Fluorescent beads, rat tail tendon, gold nanoparticles and pollen grain images using various nonlinear effects will be shown and discussed.

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