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Phase transformations in solid pharmaceutical materials studied by AFM, ESCA, DSC and SAXS /Mahlin, Denny, January 2004 (has links)
Diss. (sammanfattning) Uppsala : Univ., 2004. / Härtill 4 uppsatser.
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Development of iron oxide based nanoparticles as dual-modality imaging probesGuo, Yi. January 2008 (has links)
Thesis (M.S.) -- University of Texas Southwestern Medical Center at Dallas, 2008. / Vita. Bibliography: p. 78-94.
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Near Field Scanning Optical Microscopy(NSOM) of nano devicesLow, Chun Hong. January 2008 (has links) (PDF)
Thesis (M.S. in Combat Systems Science and Technology)--Naval Postgraduate School, December 2008. / Thesis Advisor(s): Haegel, Nancy M. ; Luscombe, James. "December 2008." Description based on title screen as viewed on January 29, 2009. Sponsoring/Monitoring Agency Report Number: "DMR-0526330." Includes bibliographical references (p. 59-61). Also available in print.
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Atomic force microscopy : atomic resolution imaging and force-distance spectroscopyGrimble, Ralph Ashley January 1999 (has links)
No description available.
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The diffusion of phosphorus into diamond from phosphorus-doped silicon through field enhanced diffusion by optical activationMoreno, Dickerson C., January 2003 (has links)
Thesis (Ph. D.)--University of Missouri-Columbia, 2003. / Typescript. Vita. Includes bibliographical references (leaves 107-109). Also available on the Internet.
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The diffusion of phosphorus into diamond from phosphorus-doped silicon through field enhanced diffusion by optical activation /Moreno, Dickerson C., January 2003 (has links)
Thesis (Ph. D.)--University of Missouri-Columbia, 2003. / Typescript. Vita. Includes bibliographical references (leaves 107-109). Also available on the Internet.
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The scanning probe microscopy study of thin polymer filmsHarron, Hamish Robert January 1995 (has links)
No description available.
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Atomic force microscopic studies of inner ear structure and mechanics /Zelenskaya, Alexandra, January 2004 (has links)
Diss. Stockholm : Karol. inst., 2004.
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Developing alternating current scanning tunneling microscopy and atomic force microscopy to measure thin film properties on the nanoscale /Szuchmacher, Amy L. January 2000 (has links)
Thesis (Ph. D.)--University of Washington, 2000. / Vita. Includes bibliographical references (leaves 239-244).
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Two-dimensional dopant profiling for shallow junctions by TEM and AFMYoo, Kyung-Dong January 2000 (has links)
No description available.
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