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Design and development of a portable Moiré interferometerRamasubramanian, Srikanth, January 2004 (has links)
Thesis (M.S.)--West Virginia University, 2004. / Title from document title page. Document formatted into pages; contains x, 132 p. : ill. (some col.). Vita. Includes abstract. Includes bibliographical references (p. 131).
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An experimental approach by "shadow moire method" with application on cornea deformationDeng, Xiao Qi 08 1900 (has links)
No description available.
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Analysis of ductile fracture under biaxial loading using moiré interferometry /Dadkhah, Mahyar Sh., January 1988 (has links)
Thesis (Ph. D.)--University of Washington, 1988. / Vita. Includes bibliographical references.
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Prediction of screener-induced moire in digital halftone pattern generation /Comeau, Richard G. January 1990 (has links)
Thesis (M.S.)--Rochester Institute of Technology, 1990. / Includes bibliographical references (leaves 75-77).
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Moire ́interferometry at high temperatures /Wu, Jau-Je, January 1992 (has links)
Thesis (Ph. D.)--Virginia Polytechnic Institute and State University, 1992. / Vita. Abstract. Includes bibliographical references (leaves 114-120). Also available via the Internet.
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Incoherent projection Moire contour sensing with coherent processing for large structures /Ott, Melanie N., January 1993 (has links)
Thesis (M.S.)--Virginia Polytechnic Institute and State University, 1993. / Vita. Abstract. Includes bibliographical references (leaves 109-111). Also available via the Internet.
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Moire interferometry for out-of-plane displacement measurement /Cheung, Mun-tong. January 1989 (has links)
Thesis (M. Phil.)--University of Hong Kong, 1990.
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Development of a three dimensional copier system using shadow Moiré and rapid prototyping technology /Tang, Huiliang. January 2005 (has links) (PDF)
Thesis (M.Phil.)--City University of Hong Kong, 2005. / "Submitted to Department of Manufacturing Engineering and Engineering Management in partial fulfillment of the requirements for the degree of Master of Philosophy" Includes bibliographical references (leaves 79-80)
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Processing improvement of moiré interferometry for accurate crack-tip deformation measurementKamil, Ridha. January 2001 (has links)
Thesis (M.S.)--West Virginia University, 2001. / Title from document title page. Document formatted into pages; contains v, 81 p. : ill. (some col.). Includes abstract. Includes bibliographical references (p. 80-81).
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Analysis of the residual stresses in silicon wafers using shadow Moiré techniqueVrinceanu, Isabela D. 08 1900 (has links)
No description available.
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