Atomic lifetimes of selected levels in Neon I and Argon I were measured using a method of delayed coincidence. Pulsed rf was used to excite a discharge tube containing the neon and argon gas. The radiation emitted from the excited atoms of the gas was passed through a monochromator so only the desired wavelength would be observed. Each time an excitation pulse ended, the decay of light intensity was detected by a photomultiplier tube. By measuring the decay time of the light intensity using the delayed coincidence technique, the average lifetime of the desired level was determined. The values of lifetimes determined in this study were found to contain considerable error. Several factors contributing to these errors were thought to be the shape of the rf pulses and an effort known as cascading which was caused by the use of rf for excitation of the gas.