[pt] Reflectometria óptica de baixa coerência tem se tornado uma importante ferramenta para a caracterização de componentes ópticos e optoeletrônicos integrados, cujas dimensões são micrométricos. Este trabalho inclui os princípios básicos de reflectometria, um estudo aprofundado de reflectometria óptica de baixa coerência, uma revisão das técnicas demonstradas na literatura cientifíca e suas resoluções e, principalmente, uma nova topologia na montagem experimental. Esta nova topologia permite que as mediadas sejam feitas de maneira mais simples e eficaz. A resolução obtida ficou tão boa que permitiu a visualização dos modos de propagação TE E TM na cavidade de um laser semicondutor. / [en] Optical low Coherence Reflectometry has become an important tool for the characterization of optical and integrated optoeletronics components of dimensions on the micrometer scale. This work includes the basic principles of reflectometry, a detailed study of optical low coherence reflectometry, a review of the techniques reported in the literature and a new scheme for the experimental set-up. This new scheme has proved to be simpler and more efficient. In addition the high resolution achieved allowed the visual observation of the TE and TM propagation modes in the semiconductior cavity.

[pt] Reflectometria Ótica de Baixa Coerência (OLCR) é uma importante técnica não-destrutiva para a caracterização de guias de onda óticos. Este trabalho apresenta um estudo sobre a multiplicação de soluções que aparecem com uma nova configuração, que coloca o dispositivo fora dos braços do interferômetro. Duas técnicas foram desenvolvidas para resolver esse problema. Uma delas é baseada na correlação de medidas feitas com o dispositivo em duas posições diferentes. A outra técnica elimina a dualidade pela modulação da fase das reflexões provenientes do dispositivo. Ambas as técnicas eliminaram os picos indesejáveis satisfatoriamente, tornando mais fácil a observação das reflexões. A resolução não foi alterada pela modulação, e um elevada sensibilidade foi obtida. Um método para medidas de atenuação, baseado em sistemas de OLCR, foi apresentado. Se o coeficiente de reflexão for bem conhecido, o seu uso para medidas em guias de onda, tais como moduladores eletro-óticos, pode ser bastante interessante. / [en] Optical Low Coherence Reflectometry (OLCR) is na important non-destructive method for characterization of optical waveguides. This work presents a study of the plurality of solutions that appear with a new configuration, which places the device out of both arms of the interferometer. Two techniques were developed to solve this problem. One of them is based on the correlation of measurements made with the device in two different positions. The other technique removes the ambiguity by modulating the phase of the reflections from the interferometer. Both techniques have eliminated the undesirable peaks sucessfully, making the observation of the reflections more easy. The resolution was not changed by the modulation, and a high sensitivy was achieved. A method for attenuation measurements, based on OLCR systems, was presented. If the reflection coefficient is well know, its use for measurements of optical waveguides, such as modulators, could be very interesting.

[pt] A reflectometria coerente tem se mostrado uma importante técnica para caracterização dos dispositivos ópticos e optoeletrônicos presentes nos sistemas de comunicações. Neste trabalho, a reflectometria coerente no domínio da freqüência foi utilizada no estudo das características dos lasers de semicondutor de realimentação distribuída. Foram realizadas medidas da resposta térmica do módulo laser, da linearidade da varredura em freqüência e da instabilidade de freqüência devido às reflexões da luz nas conexões do sistema. Conhecendo estas informações é possível saber algumas limitações da técnica. Todas as medidas de caracterização são feitas de formas simples e prática. / [en] Coherente reflectometry has been an important technique for characterization of optinal and optoeletronics devices used in communications systems. In this work, Coherente frequency domain reflectometry was used in the study of the Distributed-Feedback Semiconductor lasers characteristics. The measurement of thermal response of the laser module, linearity of the frequency sweep and frequency instabilities induced by feedback light reflected at the systems conections was was done. With these informations it is possible to know some limitations of the technique.

[pt] O uso de amplificadores a fibra dopada, principalmente o amplificador a fibra dopada com érbio (EDFA), permitiram um grande avanço no desenvolvimento das comunicações ópticas e, o uso de ferramentas para caracterizar estes dispositivos é de grande importância. A técnica de reflectometria óptica no domínio da freqüência (OFDR), é bastante eficiente por se tratar de uma técnica não destrutiva e possibilitar a caracterização do ganho através de medidas de ganho distribuído em fibras dopadas. Neste trabalho foi construído um sistema OFDR sintonizável permitindo medidas em diferentes comprimentos de onda, para caracterização de EDFA, operando na banda C (1530-1565 nm) e L (1565-1610 nm), e também fibras dopadas com túlio, operando na banda S (1450-1530 nm). Graças a estas medidas, foram feitos estudos de diversos esquemas de bombeamento e diferentes topologias visando um melhor entendimento e desempenho dos dispositivos, sempre de forma não destrutiva. / [en] The use of doped fiber amplifiers, especially erbium doped- fiber amplifier (EDFA), has been permitted a great advance in optical communications development, and the use of some tools to characterize these devices has a great importance. The optical frequency domain reflectometry technique (OFDR) is very efficient because it is a non-destructive technique and allows the characterization of the gain through distributed gain measurements. In this work a tunable OFDR system was built permitting to perform measurements in different wavelengths, for characterization in EDFA working in C (1530-1565 nm) and L (1565-1610 nm) bands, as well as Thulium doped fibers operating in S (1450-1530 nm) band. Thanks to these measurements, some different pump schemes studies have been made and also different amplifier topologies to find a best device performance, always in a non-destructive way.

[pt] Diante do crescimento do interesse pelos amplificadores Raman faz-se necessário um estudo mais detalhado destes. Uma técnica tradicionalmente já utilizada para analise de atenuação em enlaces, a reflectometria óptica no domínio do tempo, é empregada de maneira inovadora neste trabalho para a observação da amplificação Raman distribuída. O objetivo principal deste trabalho não é a analise de amplificadores Raman, mas sim a apresentação desta técnica como nova ferramenta observação do ganho Raman distribuído em fibras ópticas. / [en] Due to increased interest in Raman amplifiers, a more detailed study of them is required. A technique traditionally used for analysis of attenuation on optical links, time domain optical reflectometry, is used in an innovative way in this work for observation of distributed Raman amplification. The main objective of this work in not the analysis of Raman amplifiers, but the introduction of this technique as a new tool for the observation of distributed Raman gain in optical fibers.

Interfacial features of polymers are a complex, fascinating topic, and industrially very important. There is clearly a need to understand interactions between polymer layers as they can be used for controlling surface properties, colloidal stability and lubrication. The aim of my Ph.D study was to investigate fundamental phenomena of polymers at interfaces, covering adsorption, interactions between polymer layers and surfactants, surface forces and friction between adsorbed layers. A branched brush layer with high water content was formed on silica surfaces by a diblock copolymer, (METAC)m-b-(PEO45MEMA)n, via physisorption. The adsorption properties were determined using several complementary methods. Interactions between pre-adsorbed branched brush layers and the anionic surfactant SDS were investigated as well. Surface forces and friction between polymer layers in aqueous media were investigated by employing the Atomic Force Microscopy (AFM) colloidal probe technique. Friction forces between the surfaces coated by (METAC)m-b-(PEO45MEMA)n in water are characterized by a low friction coefficient. Further, the layers remain intact under high load and shear, and no destruction of the layer was noted even under the highest pressure employed, about 50 MPa. Interactions between polymer layers formed by a temperature responsive diblock copolymer, PIPOZ60-b-PAMPTMA17 (phase transition temperature of 46.1 °C), was investigated in the temperature interval 25-50 °C by using the AFM colloidal probe technique. Friction between the layers increases with increasing temperature (25-45 °C), while at 50 °C friction was found to be slightly lower than that at 45 °C. We suggest that this is due to decreased energy dissipation caused by PIPOZ chains crystallizing in water above the phase transition temperature. The structure of 1,2-dipalmitoyl-sn-glycero-3-phosphocholine (DPPC) bilayers was determined by X-ray reflectometry. Surface forces and friction between DPPC bilayer-coated silica surfaces were measured utilizing the AFM colloidal probe technique. Our study showed that DPPC bilayers are able to provide low friction forces both in the gel (below ≈ 41°C) and in the liquid crystalline state (above ≈ 41°C). However, the load bearing capacity is lower in the gel state. This is attributed to a higher rigidity and lower self-healing capacity of the DPPC bilayer in the gel state. Friction forces in single asperity contact acting between a micro-patterned silicon surface and an AFM tip was measured in air. We found that both nanoscale surface heterogeneities and the µm-sized depressions affect friction forces, and considerable reproducible variations were found along a particular scan line. Nevertheless, Amontons’ first rule described average friction forces reasonably well. Amontons’ third rule and Euler’s rule were found to be less applicable to our system. / <p>QC 20141209</p>

Le projet FUI12 RLDO – dans le cadre duquel s’inscrit cette thèse – préconise une solution de réseau de topologie en étoile passive pour la montée en débit des réseaux domestiques. Cette solution de réseau rencontre des difficultés dans son implémentation avec la non-uniformité des puissances des ports de sortie des coupleurs multimodes. L’analyse de ce point nous a permis de comprendre que les propriétés des modes de propagation dans les éléments du réseau jouent un rôle clé dans les problèmes rencontrés. Pour caractériser la propagation dans le réseau, nous avons développé un banc de réflectométrie optique complexe dans le domaine fréquentiel. Les phénomènes limitant la sensibilité à la phase – liés en particulier à la non-linéarité du balayage en fréquence de la source laser – sont étudiés pour contribuer à une meilleure compréhension des mécanismes. Puis les performances de la mesure en intensité et en phase de l’instrument que nous avons mis en place sont testées. Nous avons aussi étudié les conditions de résolution optimales pour caractériser les modes d’un guide multimode et analysé l’incertitude sur la dispersion chromatique dans le cas où il est impossible de déterminer si on a accès à un mode ou plusieurs modes dans un diagramme de dispersion donné. Nous introduisons par la suite une méthode d’analyse temps-fréquence adaptative, permettant d’obtenir les courbes de dispersions avec une résolution optimale. Cette méthode nous a permis de montrer le caractère quasi-monomode, en condition d’excitation monomode, de la fibre multimode spéciale RLDO à 1310 nm et à 1550 nm. L’analyse de la propagation dans les fibres optiques, associée au modèle que nous avons développé pour comprendre le fonctionnement des coupleurs multimodes, a permis d’expliquer les difficultés rencontré avec les premières expérimentations de la topologie de réseau en étoile passive multimode et d’envisager des pistes de réalisation d’un prototype de réseau fonctionnel / In order to develop high capacity future-proof home network, the FUI 12 RLDO project suggests passive star network topology using multimode couplers. This topology encounters implementation difficulties due to the non-uniformity of the power distribution in the output ports of multimode couplers. Analyzing this problem shows that the properties of modes propagating in the network elements plays a key role in this non-uniform characteristics of multimode couplers. In order to characterize these modes propagating in the network, we have developed a complex optical frequency domain reflectometry (OFDR) setup. The phenomena limiting the sensitivity to the phase in OFDR – in fact, those related to the non-linear frequency tuning of the laser source - are investigated to contribute to a better understanding of the limiting mechanisms. Then we have tested the intensity and phase measurement performance of the developed setup. Later, we studied the optimal resolution conditions to characterize the modes in a multimode waveguide. We have also analyzed the uncertainty of the measurement of the chromatic dispersion of modes in case where it is impossible to determine whether one or several modes are present in a given dispersion curve. Additionally, we have introduced an adaptive time-frequency method, to obtain the dispersion curves with optimal resolution. This method allows us to show the versatility of the special RLDO multimode fiber (single-mode behavior under single-mode excitation at 1310 nm and 1550 nm). The analysis of the propagation in the optical fibers, associated with a model we have developed to study the behavior of multimode couplers, has permitted to explain encountered difficulties with the experiments of the multimode passive star network topology. This also gives insights to develop a functional prototype of network

The aim of master's thesis is to get familiarized with the problems of measurement and analysis of seismic waves. Theoretical part deals with the description of seismic waves, especially their types, sources and properties. Attention was afterwards focused on the measurement systems of these waves, emphasis was placed on their principles and advantages. The practical part discusses methods of noise reduction and highlighting of significant events in measured data. At the end, individual methods are implemented into user-friendly graphical interface.