Phase measuring Profilometry (PMP) is an important technique used in 3D data acquisition. Many variations of the PMP technique exist in the research world. The technique involves projecting phase shifted versions of sinusoidal patterns with known frequency. The 3D information is obtained from the amount of phase deviation that the target object introduces in the captured patterns. Using patterns based on single frequency result in projecting a large number of patterns necessary to achieve minimal reconstruction errors. By using more than one frequency, that is multi-frequency, the error is reduced with the same number of total patterns projected as in the single frequency case. The first major goal of our research work is to minimize the error in 3D reconstruction for a given scan time using multiple frequency sine wave patterns. A mathematical model to estimate the optimal frequency values and the number of phase shift patterns based on stochastic analysis is given. Experiments are conducted by implementing the mathematical model to estimate the optimal frequencies and the number of patterns projected for each frequency level used. The reduction in 3D reconstruction errors and the quality of the 3D data obtained shows the validity of the proposed mathematical model. The second major goal of our research work is the implementation of a post-processing algorithm based on stereo correspondence matching adapted to structured light illumination. Composite pattern is created by combining multiple phase shift patterns and using principles from communication theory. Composite pattern is a novel technique for obtaining real time 3D depth information. The depth obtained by the demodulation of captured composite patterns is generally noisy compared to the multi-pattern approach. In order to obtain realistic 3D depth information, we propose a post-processing algorithm based on dynamic programming. Two different communication theory principles namely, Amplitude Modulation (AM) and Double Side Band Suppressed Carrier (DSBSC) are used to create the composite patterns. As a result of this research work, we developed a series of low-cost structured light scanners based on the multi-frequency PMP technique and tested them for their accuracy in different 3D applications. Three such scanners with different camera systems have been delivered to Toyota for vehicle assembly line inspection. All the scanners use off the shelf components. Two more scanners namely, the single fingerprint and the palmprint scanner developed as part of the Department of Homeland Security grant are in prototype and testing stages.

Multi Frequency Phase Measuring Profilometry is the most popular lateral contact 3-D Scanning technique. The Phase Measuring Profilometry is limited in resolution by the projector and cameras used. Conventional signal projectors have a maximum of 2000 to 4000 scan lines limiting the projector resolution. To obtain greater detail with higher resolution the PMP technique is applied to a Spatial Light Modulator (SLM) having 12000 lines, very large as compared to conventional projectors. This technology can achieve super resolution scans having varied applications. Scans achieved from PMP suffer from a certain type of artifact called “banding” which are periodic bands across the captured target. This leads to incorrect measurement of surfaces. Banding is the most limiting noise source in PMP because it increases with lower frequency and decrease in number of patterns. The requirement for lager number of patterns increases the possibility of motion banding. The requirement for higher frequency leads to the necessity for multifrequency PMP which, again leads to more patterns and longer scan times. We aim to reduce the banding by correcting the phase of the captured data.

Phase Measuring Profilometry (PMP) is the most robust scanning technique for static 3D data acquisition. To make this technique robust to the target objects which are in motion during the scan interval a novel algorithm called ‘Pattern Interleaving’ is used to get a high density single scan image and making Phase Measuring Profilometry insensitive to ‘z’ motion and prevent motion banding which is predominant in 3D reconstruction when the object is in motion during the scan time

Structured light illumination (SLI) is the process of projecting a series of light striped patterns such that, when viewed at an angle, a digital camera can reconstruct a 3-D model of a target object's surface. But by relying on a series of time multiplexed patterns, SLI is not typically associated with video applications. For this purpose of acquiring 3-D video, a common SLI technique is to drive the projector/camera pair at very high frame rates such that any object's motion is small over the pattern set. But at these high frame rates, the speed at which the incoming video can be processed becomes an issue. So much so that many video-based SLI systems record camera frames to memory and then apply off-line processing. In order to overcome this processing bottleneck and produce 3-D point clouds in real-time, we present a lookup-table (LUT) based solution that in our experiments, using a 640 by 480 video stream, can generate intermediate phase data at 1063.8 frames per second and full 3-D coordinate point clouds at 228.3 frames per second. These achievements are 25 and 10 times faster than previously reported studies. At the same time, a novel dual-frequency pattern is developed which combines a high-frequency sinusoid component with a unit-frequency sinusoid component, where the high-frequency component is used to generate robust phase information and the unit-frequency component is used to reduce phase unwrapping ambiguities. Finally, we developed a gamma model for SLI, which can correct the non-linear distortion caused by the optical devices. For three-step phase measuring profilometry (PMP), analysis of the root mean squared error of the corrected phase showed a 60х reduction in phase error when the gamma calibration is performed versus 33х reduction without calibration.

Structured Light Illumination (SLI) is the process where spatially varied patterns are projected onto a 3-D surface and based on the distortion by the surface topology, phase information can be calculated and a 3D model constructed. Phase Measuring Profilometry (PMP) is a particular type of SLI that requires three or more patterns temporarily multiplexed. High speed PMP attempts to scan moving objects whose motion is small so as to have little impact on the 3-D model. Given that practically all machine vision cameras and high speed cameras employ a Field Programmable Gate Array (FPGA) interface directly to the image sensors, the opportunity exists to do the processing on camera. This thesis focuses on the design, implementation, testing, and evaluation of a camera-projector system to implement a PMP dual-frequency scheme for 3-D shape measurement on a single FPGA chip. The processor architecture is implemented and tested using the Xilinx Spartan 3 FPGA chip on an Opal Kelly development board. The hardware is described using VHDL and Verilog Hardware Description Languages (HDLs).